Bruker SkyScan benchtop system features high-speed X-ray microtomography

March 20, 2017
Source: ASM International

Bruker, Billerica, Mass., introduces the SkyScan 1275, a high-speed X-ray microtomography benchtop system specially designed for fast scanning by new advances in the technology of X-ray sources and efficient flat-panel detectors. Shortening the distance between source and detector, and very fast camera readout, make possible reducing scan time down to a few minutes without compromising image quality. Current developments in fast reconstruction, accelerated by graphics cards, give an additional gain in performance and speed.

Fast realistic visualization of results by volume rendering enables excellent imaging of internal microstructure with power to reveal all internal details by virtual cut or virtual flight around and inside the sample.

The SkyScan1275 provides a high level of automation. Simple push of a button on the front of the system starts an auto-sequence of a fast scan followed by reconstruction and volume rendering executed during scanning of the next sample.

Featuring  an optional 16-position sample changer, predefined push-button microCT sequences fully automate the scanning, reconstruction, and visualization of internal microstructures. The new extended version accepts samples up to 200 mm in length. Its helical scanning and reconstruction mode provide improvements in 3D metrology for materials science, geological, and biomaterial applications.

www.bruker.com

 

Subject Classifications

Industries and Applications | Electronics

Industries and Applications | Nanotechnology

Materials Testing and Evaluation | Metallography and Microstructures

Materials Testing and Evaluation | Microelectronic Failure Analysis