Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.
May 24, 2017Can-Eng Furnaces International Ltd., Niagara Falls, Ontario, has been contracted to commission a turnkey 36 ft. diameter "pancake" style rotary hearth furnace for a leading North American aerospace supplier.
May 24, 2017Super Systems Inc., Cincinnati, Ohio, reports that Callies Precision Engine Components has installed an SSI automated system with the ability to achieve tight nitriding process control using an easy-to-use recipe system that maintains tight tolerances on temperature, gas flow, and nitriding potential.
May 23, 2017Anton Paar USA, Ashland, Va., presents the third generation of the Revetest scratch tester, the RST3, the only scratch tester on the market that features automatic detection of critical loads.
May 22, 2017The University of Minnesota, Minneapolis, announces that a team of researchers has developed a barium-tin-oxide transparent highly conductive thin film in which they replaced elemental tin with a chemical precursor of tin.
May 21, 2017Ultratech Inc., San Jose, Calif., announces that it has received a multiple system follow-on order for its LSA101 dual-beam laser spike anneal systems for expansion of 10-nm FinFET production.
May 21, 2017WIN Semiconductors Corp., Taiwan, has completed Phase 2 expansion at its newest wafer fab, Fab C, increasing manufacturing capacity by 20%.
May 21, 2017Rogers Corp., Chandler, Ariz., will highlight its wide range of circuit materials at the 2017 IEEE International Microwave Symposium in June.
May 21, 2017Oxford Instruments Nanoanalysis, England, has launched Symmetry, which is said to have acquisition speed in excess of 3000 indexed patterns per second.
May 21, 2017Kyocera International Inc., San Diego, announces that it has received Class Y certification for its semiconductor assembly operations.
May 21, 2017Neocera, Beltsville, Md., has developed the Magma electronic fault isolation HiRes microscope system that combines two sensors into one tool: a SQUID sensor for detecting the smallest possible currents, and a magnetoresistive sensor for best spatial resolution when scanning close to the current.