Industry News


Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.

Instron website explains new ISO 6892-1:2016 for ambient tensile testing of metals

March 22, 2017

Instron, Norwood, Mass., reports that the newly released ISO 6892-1:2016 standard for ambient tensile testing of metallic materials provides greater clarity of the major changes that were introduced in the previous version, ISO 6892-1:2009.

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Arconic to supply aluminum for new Lexus RX in multi-year deal with Toyota

March 22, 2017

Arconic, New York, announces a multi-year supply deal with Toyota North America to supply aluminum for its all-new Lexus RX models, Toyota's first vehicle in North America to prominently feature aluminum exterior panels.

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Argonne self-healing diamondlike carbon tribofilms reduce friction by 25 to 40%

March 22, 2017

Argonne National Laboratory, Lemont, Ill., announces that a research team has developed a self-lubricating diamondlike carbon tribofilm that regenerates itself by breaking down the molecules of lubricating oil and rebuilding the tribofilm as it is worn away.

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Bruker SkyScan benchtop system features high-speed X-ray microtomography

March 20, 2017

Bruker, Billerica, Mass., introduces the SkyScan 1275, a high-speed X-ray microtomography benchtop system specially designed for fast scanning using new advances in the technology of X-ray sources and efficient flat-panel detectors.

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Materion acquires Heraeus target materials for its semiconductor and other markets

March 20, 2017

Materion Corp., Mayfield Heights, Ohio, announces that it has acquired the target materials business of the Heraeus Group to strengthen its position in precious and non-precious target materials for the semiconductor, architectural and automotive glass, photovoltaic, and display markets.

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JEOL module enables mass spectrometer materials analysis by ambient ionization

March 20, 2017

JEOL, Peabody, Mass., announces that a new FilterSpray module developed for the AccuTOF-DART mass spectrometer makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization.

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Hitachi launches transmission electron microscope with improved electro-optics.

March 20, 2017

Hitachi High-Technologies Corp., Tokyo, introduces the HT7800 Series Transmission Electron Microscope, which features digital operation under normal room light conditions (like the HT7700 model) and also incorporates improved electro-optics with many new functions.

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Cadence to collaborate with TSMC for design innovation with its 12FFC process

March 20, 2017

Cadence Design Systems Inc., San Jose, Calif., announces its collaboration with the Taiwan Semiconductor Manufacturing Co. (TSMC) to further advanced-node design innovation with TSMC's new 12nm FinFET Compact (12FFC) process technology.

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January 2017 semiconductor sales up 14 percent over January 2016

March 16, 2017

The Semiconductor Industry Association, Washington, announces that worldwide sales of semiconductors reached $30.6 billion for the month of January 2017, an increase of 13.9% compared to the January 2016 total of $26.9 billion.

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Swiss researchers develop X-ray tomography for 3-D imaging of 34-nm transistor on a chip

March 16, 2017

Researchers of the Paul Scherrer Institute in Switzerland have reportedly made detailed 3-D images of a commercially available computer chip, marking the first time a nondestructive method has visualized the paths of a chip's internal 45-nm-wide wiring and its 34-nm-high transistors clearly without distortions or deformations.

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