Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.
May 22, 2017The University of Minnesota, Minneapolis, announces that a team of researchers has developed a barium-tin-oxide transparent highly conductive thin film in which they replaced elemental tin with a chemical precursor of tin.
May 21, 2017Ultratech Inc., San Jose, Calif., announces that it has received a multiple system follow-on order for its LSA101 dual-beam laser spike anneal systems for expansion of 10-nm FinFET production.
May 21, 2017WIN Semiconductors Corp., Taiwan, has completed Phase 2 expansion at its newest wafer fab, Fab C, increasing manufacturing capacity by 20%.
May 21, 2017Rogers Corp., Chandler, Ariz., will highlight its wide range of circuit materials at the 2017 IEEE International Microwave Symposium in June.
May 21, 2017Oxford Instruments Nanoanalysis, England, has launched Symmetry, which is said to have acquisition speed in excess of 3000 indexed patterns per second.
May 21, 2017Kyocera International Inc., San Diego, announces that it has received Class Y certification for its semiconductor assembly operations.
May 21, 2017Neocera, Beltsville, Md., has developed the Magma electronic fault isolation HiRes microscope system that combines two sensors into one tool: a SQUID sensor for detecting the smallest possible currents, and a magnetoresistive sensor for best spatial resolution when scanning close to the current.
May 14, 2017Oxford Instruments plc, England, announces that it has agreed to sell its Industrial Analysis business to Hitachi High-Technologies Corp. for a consideration of $100 million on a cash and debt-free basis.
May 14, 2017Hitachi High-Technologies Corp., Tokyo, announces the Hitachi ArBlade 5000 broad ion-milling system, which enables high throughput and prepares wide-area cross-sectional samples.
May 14, 2017Lasertec, Japan, introduces the Optelics Hybrid confocal microscope, in which laser and white light sources are combined in one body, for a multi-functional high-performance confocal microscope.