Industry News


Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.

Anton Paar Revetest3 coating scratch tester enables automatic detection of critical loads

May 23, 2017

Anton Paar USA, Ashland, Va., presents the third generation of the Revetest scratch tester, the RST3, the only scratch tester on the market that features automatic detection of critical loads.

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Barium-tin-oxide transparent thin film could improve electronics and solar cells

May 22, 2017

The University of Minnesota, Minneapolis, announces that a team of researchers has developed a barium-tin-oxide transparent highly conductive thin film in which they replaced elemental tin with a chemical precursor of tin.

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Ultratech dual-beam laser spike anneal systems to treat FinFET for 10-nm nodes

May 21, 2017

Ultratech Inc., San Jose, Calif., announces that it has received a multiple system follow-on order for its LSA101 dual-beam laser spike anneal systems for expansion of 10-nm FinFET production.

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WIN Semiconductors completes expansion, increases GaAs wafer capacity by 20%

May 21, 2017

WIN Semiconductors Corp., Taiwan, has completed Phase 2 expansion at its newest wafer fab, Fab C, increasing manufacturing capacity by 20%.

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Rogers to exhibit high-performance circuit materials at microwave symposium

May 21, 2017

Rogers Corp., Chandler, Ariz., will highlight its wide range of circuit materials at the 2017 IEEE International Microwave Symposium in June.

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CMOS-based electron backscatter diffraction detector acquires 3000 patterns/second

May 21, 2017

Oxford Instruments Nanoanalysis, England, has launched Symmetry, which is said to have acquisition speed in excess of 3000 indexed patterns per second.

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Kyocera certified to supply ceramic semiconductor packaging for space vehicles

May 21, 2017

Kyocera International Inc., San Diego, announces that it has received Class Y certification for its semiconductor assembly operations.

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Two-sensor-tool imaging technology detects dead open faults with high accuracy

May 21, 2017

Neocera, Beltsville, Md., has developed the Magma electronic fault isolation HiRes microscope system that combines two sensors into one tool: a SQUID sensor for detecting the smallest possible currents, and a magnetoresistive sensor for best spatial resolution when scanning close to the current.

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Oxford Instruments to sell Industrial Analysis business to Hitachi High-Technologies

May 14, 2017

Oxford Instruments plc, England, announces that it has agreed to sell its Industrial Analysis business to Hitachi High-Technologies Corp. for a consideration of $100 million on a cash and debt-free basis.

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Hitachi ion-milling system capable of high-speed and wide-area material processing

May 14, 2017

Hitachi High-Technologies Corp., Tokyo, announces the Hitachi ArBlade 5000 broad ion-milling system, which enables high throughput and prepares wide-area cross-sectional samples.

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