Conference Proceedings

ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

Published: 2015

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

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ISTFA 2014: Proceedings of the 40th International Symposium for Testing and Failure Analysis (November 9–13, 2014, Houston, Texas, USA)

Published: 2014

"Exploring the Many Facets of Failure Analysis," is the theme of the 40th International Symposium for Testing and Failure Analysis (ISTFA 2014), November 9–13, 2014, at the George R. Brown Convention Center in Houston, Texas, USA.

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ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis, A Complete Proceedings

Published: 2013

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis

Published: 2012

Complete proceedings, 105 papers, from ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis, November 11-15, 2012, Phoenix, Arizona,

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ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis

Published: November 01, 2011

Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose, California,

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ISTFA 2010: Proceedings of the 36th International Symposium for Testing and Failure Analysis

Published: November 01, 2010

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2009 Proceedings from the 35th International Symposium for Testing and Failure Analysis (book + CD)

Published: October 30, 2009

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2008: Proceedings of the 34th International Symposium for Testing and Failure Analysis

Published: October 31, 2008

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis

Published: 2007

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.

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ISTFA 2005: International Symposium for Testing and Failure Analysis (Book and CD-ROM)

Published: 2005

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers included cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures.

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