Fundamentals of Photon Emission (PEM) in Silicon – Electroluminescence for Analysis of Electronic Circuit and Device Functionality

Author: Christian Boit, TUB Berlin University of Technology   |   Document Download   |   Product code: ZMEFA2011P279

File size: 2 MB

Classified as: Electronic Materials Electronics

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Photon Emission (PEM) has proven to be the most successful tool for localization of fails in electrical functionality of ICs also it is based on very faint light emission events. It has emerged almost 20 years ago as a very simple and not overly expensive technique that recorded emission positions as indicator or of failing circuitry quickly, much easier and inside silicon more sensitive than the alternative liquid crystal thermography.
  • From: Microelectronics Failure Analysis, Desk Reference Sixth Edition
  • Published: October 01, 2011
  • Pages: 279 - 291 (13)
  • Review Type: Peer reviewed