FEI Co., Hillsboro, Ore., released the new Themis Z scanning/transmission electron microscope (S/TEM), an automated STEM that offers the industry leading specifications for image resolution, analytical speed and quality, and light element imaging sensitivity. The new instrument was featured last week at the Microscopy and Microanalysis meeting in Columbus, Ohio.
The Themis Z S/TEM delivers the highest available specified performance in three critical areas as compared to other commercially available offerings:
- Image resolution—Improvements in system stability and automated tuning routines allow the Themis Z to reproducibly deliver the high image resolution at high and low beam energies in both STEM and TEM modes for all users. In addition to the resolution and impressive analytical performance, a generous pole gap configuration provides the space to do more applications like 3D tomography and allows excellent performance for in situ experiments.
- Analytical speed and quality—A portfolio of energy dispersive x-ray (EDX) systems allows users to configure their system based on their primary characterization needs. When speed matters most, the new Dual X detector system combines large solid angle and high count rates with low-noise, high-energy resolution. Its symmetrical design ensures high-quality 3D chemical mapping and accurate quantification. When spectral quality is first priority and versatility is important – for instance, to accommodate in-situ holders – the Super X system’s low noise and excellent energy resolution provide a powerful solution.
- Light element imaging—The new iDPC detector uses up to 90% of transmitted electrons to offer higher sensitivity to lighter elements compared to annular bright field (ABF) imaging techniques, while still preserving atomic-scale resolution and direct image interpretation.
