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ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

Document Download   |   Product code: ZCP2015ISTFA

File size: 54 MB

Classified as: Failure Analysis Fatigue ...more

Free to Members

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

  • From:

    ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

  • Publisher: ASM International
  • Published: 2015
  • Pages: 500