{"version":"1.0","provider_name":"Electronic Device Failure Analysis Society","provider_url":"https:\/\/www.asminternational.org\/edfas","author_name":"Electronic Device Failure Analysis Society","author_url":"https:\/\/www.asminternational.org\/edfas","title":"Society News - Electronic Device Failure Analysis Society","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"fyG8ByVgqJ\"><a href=\"https:\/\/www.asminternational.org\/edfas\/about\/society-news\/\">Society News<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.asminternational.org\/edfas\/about\/society-news\/embed\/#?secret=fyG8ByVgqJ\" width=\"600\" height=\"338\" title=\"&#8220;Society News&#8221; &#8212; Electronic Device Failure Analysis Society\" data-secret=\"fyG8ByVgqJ\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","description":"Society News EDFAS Lifetime Achievement Award EDFAS Lifetime Achievement Award was established by the EDFAS Board of Directors in 2015 to recognize leaders in the EDFAS community who have devoted their time, knowledge and abilities towards the advancement of the electronic device failure analysis industry. The 2025 awardee is David Hung-I Su, retired, previous director... View Article"}