{"version":"1.0","provider_name":"Electronic Device Failure Analysis Society","provider_url":"https:\/\/www.asminternational.org\/edfas","author_name":"Electronic Device Failure Analysis Society","author_url":"https:\/\/www.asminternational.org\/edfas","title":"What's New - Electronic Device Failure Analysis Society","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"sMw22Yok2M\"><a href=\"https:\/\/www.asminternational.org\/edfas\/about\/whats-new\/\">What&#8217;s New<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.asminternational.org\/edfas\/about\/whats-new\/embed\/#?secret=sMw22Yok2M\" width=\"600\" height=\"338\" title=\"&#8220;What&#8217;s New&#8221; &#8212; Electronic Device Failure Analysis Society\" data-secret=\"sMw22Yok2M\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","description":"What&#8217;s New Microelectronics Failure Analysis Desk Reference, Seventh Edition (print) is up on the website EDFAS proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International, available this fall. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures.... View Article"}