{"version":"1.0","provider_name":"Electronic Device Failure Analysis Society","provider_url":"https:\/\/www.asminternational.org\/edfas","author_name":"Debbie Sniderman","author_url":"https:\/\/www.asminternational.org\/edfas\/author\/dsniderman\/","title":"Ferroelectric materials boost data storage potential - Electronic Device Failure Analysis Society","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"Pt8M7ZQwlf\"><a href=\"https:\/\/www.asminternational.org\/edfas\/ferroelectric-materials-boost-data-storage-potential\/\">Ferroelectric materials boost data storage potential<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.asminternational.org\/edfas\/ferroelectric-materials-boost-data-storage-potential\/embed\/#?secret=Pt8M7ZQwlf\" width=\"600\" height=\"338\" title=\"&#8220;Ferroelectric materials boost data storage potential&#8221; &#8212; Electronic Device Failure Analysis Society\" data-secret=\"Pt8M7ZQwlf\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2026\/01\/EDFAS__012226__ORNL__400.webp","thumbnail_width":400,"thumbnail_height":225,"description":"Researchers at Oak Ridge National Laboratory, Oak Ridge, Tenn., modified a commercial atomic force microscope with artificial intelligence to assemble and detect patterns in bismuth ferrite and analyze defects at the materials\u2019 surface, advancing the understanding of these materials and enabling innovative data storage and computation methods."}