{"id":115,"date":"2014-05-28T14:25:36","date_gmt":"2014-05-28T14:25:36","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/membership\/societyawards\/"},"modified":"2026-04-03T12:38:16","modified_gmt":"2026-04-03T12:38:16","slug":"societyawards","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/societyawards\/","title":{"rendered":"Society Awards"},"content":{"rendered":"\t\t
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EDFAS Society Awards<\/h1>

EDFAS offers awards to honor outstanding contributions and achievements within our field. These awards shine a spotlight on members who exemplify innovation, leadership, and dedication to advancing electronic device failure analysis. Awards will be presented annually at ISTFA.<\/p>

Do you know someone whose work deserves recognition? Nominate a deserving colleague today and help us celebrate the best in our community!<\/p>

EDFAS Lifetime Achievement Award<\/span><\/h2>

EDFAS Lifetime Achievement Award was established by the EDFAS Board of Directors in 2015 to recognize leaders in the EDFAS community who have devoted their time, knowledge and abilities towards the advancement of the electronic device failure analysis industry. Nomination deadline is March 1.<\/strong><\/p>

View rules<\/a><\/p>

Candidate Nomination Application Link<\/a><\/p>

Past Award Recipients<\/strong><\/a><\/p>

EDFAS President’s Award<\/span><\/h2>

The EDFAS President’s Award shall recognize exceptional service to the EDFAS and the electronic device failure analysis community. Examples of such service includes, but are not limited to, committee service, service on the Board of Directors, organization of conferences or symposia, development of education courses, student and general public outreach. While any member of EDFAS is expected to further the Society’s goals through service, this Award shall recognize those who provided an exceptional amount of effort in their service to the Society. Nomination deadline is May 1.<\/strong><\/p>

View rules<\/a><\/p>

Candidate Nomination Application Link<\/a><\/p>

Past Award Recipients<\/a><\/strong><\/p>

EDFAS Volunteering Excellence Award<\/span><\/h2>

The EDFAS Volunteering Excellence Award honors members of EDFAS who exemplify the highest ideals of volunteer service. The vitality and success of EDFAS depends on its members, and their willingness to contribute their time and talents for the good of the society and the electronic device failure analysis community.<\/p>

The purpose of this award is to recognize those whose selfless commitment, positive attitude, and enthusiastic service embody the true spirit of volunteerism. These individuals consistently go above and beyond, making a meaningful and lasting impact through their contributions to EDFAS initiatives, local chapters, and committees. Nomination deadline is March 1.<\/strong><\/p>

View Rules<\/a><\/p>

Candidate Nomination Application Link<\/a><\/p>

If you have any questions, please contact:<\/p>

Mary Anne Jerson<\/strong>
Administrative Assistant, Affiliates Societies
ASM International
9639 Kinsman Road
Materials Park, OH 44073
Phone: 440.671.3877
maryanne.jerson@asminternational.org<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

EDFAS Society Awards EDFAS offers awards to honor outstanding contributions and achievements within our field. These awards shine a spotlight on members who exemplify innovation, leadership, and dedication to advancing electronic device failure analysis. Awards will be presented annually at ISTFA. Do you know someone whose work deserves recognition? Nominate a deserving colleague today and… View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-115","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\nSociety Awards - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/societyawards\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Society Awards - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"EDFAS Society Awards EDFAS offers awards to honor outstanding contributions and achievements within our field. These awards shine a spotlight on members who exemplify innovation, leadership, and dedication to advancing electronic device failure analysis. Awards will be presented annually at ISTFA. Do you know someone whose work deserves recognition? Nominate a deserving colleague today and... View Article\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/societyawards\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:modified_time\" content=\"2026-04-03T12:38:16+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/societyawards\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/societyawards\\\/\",\"name\":\"Society Awards - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2014-05-28T14:25:36+00:00\",\"dateModified\":\"2026-04-03T12:38:16+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/societyawards\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/societyawards\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/societyawards\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Society Awards\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Society Awards - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/societyawards\/","og_locale":"en_US","og_type":"article","og_title":"Society Awards - Electronic Device Failure Analysis Society","og_description":"EDFAS Society Awards EDFAS offers awards to honor outstanding contributions and achievements within our field. These awards shine a spotlight on members who exemplify innovation, leadership, and dedication to advancing electronic device failure analysis. Awards will be presented annually at ISTFA. Do you know someone whose work deserves recognition? Nominate a deserving colleague today and... View Article","og_url":"https:\/\/www.asminternational.org\/edfas\/societyawards\/","og_site_name":"Electronic Device Failure Analysis Society","article_modified_time":"2026-04-03T12:38:16+00:00","twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/societyawards\/","url":"https:\/\/www.asminternational.org\/edfas\/societyawards\/","name":"Society Awards - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2014-05-28T14:25:36+00:00","dateModified":"2026-04-03T12:38:16+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/societyawards\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/societyawards\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/societyawards\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Society Awards"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/115","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=115"}],"version-history":[{"count":5,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/115\/revisions"}],"predecessor-version":[{"id":9302,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/115\/revisions\/9302"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=115"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}