{"id":118,"date":"2017-08-17T20:18:12","date_gmt":"2017-08-17T20:18:12","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/education\/webinars\/"},"modified":"2022-11-16T05:58:27","modified_gmt":"2022-11-16T05:58:27","slug":"webinars","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/webinars\/","title":{"rendered":"Webinars"},"content":{"rendered":"

\n\tWebinars<\/h2>\n

\n\tLearn from industry experts without leaving your desk with ASM webinars! ASM webinars deliver solution-driven content from ASM industry experts, and viewing is free of charge for all ASM members.<\/span><\/p>\n

\n\tInterested in sponsoring a webinar that has authoritative information and a powerful sales message that supports your company’s products and brand? We can help customize a materials webinar for you! <\/span>Become a Sponsor<\/a>.<\/p>\n

\n\t <\/p>\n

\n\tWebinar Archive<\/h3>\n

\n\tClick on one of the titles below to view a webinar presentation.<\/p>\n

\n\t <\/p>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
\n

\n\t\t\t\t\tDate<\/strong><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSubject<\/strong><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSponsor<\/strong><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPresenter<\/strong><\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t07\/20\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tVacuum for Instrumentation<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAgilent Technologies<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tJohn Screech<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t06\/22\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tFundamentals of Helium Leak Detection<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAgilent Technologies<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tJohn McLaren<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t06\/20\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tImproving Inspection Efficiency with Stereo Microscope Innovations<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tLeica Microsystems<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMario Gislao<\/p>\n

\n\t\t\t\t\tAlan Paris<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t06\/14\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAdvanced Analytical Microscopy for Steel and Other Metals<\/p>\n<\/td>\n

\n\t\t\t\tZEISS<\/td>\n\n

\n\t\t\t\t\tAndy Holwell<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t06\/08\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tChoosing between Additive and Subtractive Manufacturing<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tXometry<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tGreg Paulsen<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t06\/06\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPractical Applications of Braod Ion Beam Milling<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tLeica Microsystems<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tScott Walk
\n\t\t\t\t\tRobert Ranner<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t05\/12\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tColor Metallography: Bold, Bright and Beautiful<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tStruers<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tGeorge Vander Voort<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t05\/03\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tIntroduction to Analytical Microscopy for Steel and Other Metals<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tZEISS<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAndy Holwell<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t03\/30\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tImproving Powder Metal Production with Industrial Gases and Atmosphere Control Systems<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPraxair and Atmosphere Engineering<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSteve Mueller and Eric Jossart<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t02\/07\/17<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSmarter Benchtop Test for Reduced Turnaround Time<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMentor Graphics<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tGeir Eide<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t12\/08\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMastering Multiscale Challenges with Correlative Microscopy<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tZEISS<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tJeff Gelb<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t11\/14\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tApplication of CALPHAD-based Tools for Additive Manufacturing of Metals and Alloys<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tThermo-Calc<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPaul Mason<\/p>\n

\n\t\t\t\t\tSuresh Babu<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t11\/10\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tBarkhausen Noise: An Alternative Nondestructive Testing Method in Ferromagnetic Materials<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAmerican Stress Technologies<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tWade Gubbels<\/p>\n

\n\t\t\t\t\tJames Thomas<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t11\/08\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\t3D X-ray Microscopy for Nondestructive Imaging<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tZEISS<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDr. Leah Lucas Lavery<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t10\/25\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMetallurgical Aspects of Distortion and Residual Stresses in Heat Treated Parts<\/a><\/p>\n

\n\t\t\t\t\tIFHTSE 2016 paper (pdf)<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tHoughton International<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tD. Scott Mackenzie, FASM<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t10\/04\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMetallurgical Subtleties of Induction Hardening: Control of Distortion and Prevention of Cracking <\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tInductoheat<\/p>\n<\/td>\n

\n\t\t\t\tDr. Valery Rudnev<\/span><\/td>\n<\/tr>\n
\n

\n\t\t\t\t\t09\/08\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tTop Ten Career Advancing Moves<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tWomen in Materials Engineering Committee<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDr. Dianne Chong<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t08\/30\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAddressing Modern Challenges and Preventing Common Problems in Induction Heat Treatment<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tInductoheat<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tCollin Russell<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t06\/14\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPredictive Quenching Simulation Approach with AVL FIRE<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tAVL<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDavid Greif<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t05\/04\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tHow to Apply CALPHAD-Based Tools to Welding and Joining<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tThermo-Calc<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPaul Mason<\/p>\n

\n\t\t\t\t\tJohn DuPont<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t05\/03\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tUsing Inverted Microscopes to Analyze Grain Size<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tLeica<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tBob Cowden
\n\t\t\t\t\tThomas Locherer
\n\t\t\t\t\tStefan Motyka<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t04\/19\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSample Preparation of Nanocomposites and Nanomaterials Using Ultramicrotomy<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tLeica<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tRobert Ranner<\/p>\n

\n\t\t\t\t\tFrederic Leroux<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t03\/24\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tHow to Use Industrial Gases and Atmosphere Control to Improve Furnace Operations <\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPraxair and Atmosphere Engineering<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSteve Mueller and Eric Jossart<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t02\/18\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMetals Analysis: How to Choose Between Portable XRF, LIBS or OES for Testing and Inspection<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tOxford Instruments<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tJohn Kurtz<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t01\/26\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tWe Just Printed the Largest Titanium Part: Now What?<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tPuris<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tCraig Kirsch<\/p>\n

\n\t\t\t\t\tEric Bono<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t01\/19\/16<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tUnderstanding the Microstructure of Iron-Based Alloys<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tStruers<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tGeorge Vander Voort<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t12\/17\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tStructural Materials Data Demonstration Project: An Open Data Resource for Collaborative Innovation<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tCMDN<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tScott Henry and <\/p>\n

\n\t\t\t\t\tLarry Berardinis<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t12\/09\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tHow Additive Manufacturing May Change the Heat Treating World<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSolar Atmospheres<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tRobert Hill<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t12\/08\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDiagnosis in the FinFET Era<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMentor Graphics<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tGeir Eide<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t11\/19\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tTexture and Deformation of Titanium Alloys<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tATI<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDr. John Foltz<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t11\/18\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tUsing Digital Microscopes for Efficient Quality Control and Failure Analysis<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tCarl Zeiss Microscopy<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDr. Dominik Stehr<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t11\/04\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tASTM Grain Sizing Equipment & Application Considerations<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tLeica Microsystems<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tBob Cowden<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t10\/14\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tComputer Simulation Advances Conventional Induction Heat Treatment Practices and Helps Develop Cutting-Edge Technologies <\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tInductoheat<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tCollin A. Russell<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t09\/30\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tRecent Innovations in Induction Hardening Shafts and Components<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tInductoheat<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDr. Valery Rudnev<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t09\/24\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tTechnology Developments in Variable Pressure and High Vacuum Imaging<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tHitachi<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tJamil J. Clarke<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t09\/22\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tUnderstanding Mechanical Properties of Materials at Elevated Temperatures<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMTS<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tErik Schwarzkopf<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t09\/02\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tLove Your Job More<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tASM Women in Materials Engineering<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tKathleen Buse<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t07\/22\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tHeat Treating 400-Series Stainless Steel in Air without Scaling<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tMaterial Interface<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tSusan Kerber<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t05\/28\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tUsing Automated SEM\/EDX Analysis to Improve Your Steelmaking Process<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tFEI<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tBinyam Abraham<\/p>\n<\/td>\n<\/tr>\n

\n

\n\t\t\t\t\t04\/16\/15<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tThe Impact of Automotive Lightweighting on Materials \u2013 Solutions for Today’s Challenges<\/a><\/p>\n<\/td>\n

\n

\n\t\t\t\t\tZwick USA<\/p>\n<\/td>\n

\n

\n\t\t\t\t\tDavid Phillips<\/p>\n<\/td>\n<\/tr>\n

\n\t\t\t\t02\/05\/15<\/span><\/td>\n\n

\n\t\t\t\t\tTemperature Measurement in Vacuum Furnaces: Problems and Solutions<\/a><\/p>\n<\/td>\n

\n\t\t\t\tSolar Atmospheres<\/span><\/td>\n\n\t\t\t\tWilliam R. Jones<\/span><\/td>\n<\/tr>\n
\n\t\t\t\t01\/27\/15<\/span><\/td>\n\n

\n\t\t\t\t\tTransforming Materials Science Education by Integrating Testing and Simulation<\/a><\/p>\n<\/td>\n

\n\t\t\t\tMTS Systems Corporation<\/span><\/td>\n\n

\n\t\t\t\t\tChristoph Lesser<\/span><\/p>\n

\n\t\t\t\t\tAli P. Gordon<\/span><\/p>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

\n\t <\/p>\n","protected":false},"excerpt":{"rendered":"

Webinars Learn from industry experts without leaving your desk with ASM webinars! ASM webinars deliver solution-driven content from ASM industry experts, and viewing is free of charge for all ASM members. Interested in sponsoring a webinar that has authoritative information and a powerful sales message that supports your company’s products and brand? We can help customize… View Article<\/a><\/p>\n","protected":false},"author":59489,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-118","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\nWebinars - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/webinars\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Webinars - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Webinars Learn from industry experts without leaving your desk with ASM webinars! ASM webinars deliver solution-driven content from ASM industry experts, and viewing is free of charge for all ASM members. Interested in sponsoring a webinar that has authoritative information and a powerful sales message that supports your company’s products and brand? We can help customize... 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