{"id":128,"date":"2014-06-03T14:32:49","date_gmt":"2014-06-03T14:32:49","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/2018_photo\/2012-2\/"},"modified":"2022-11-23T06:31:30","modified_gmt":"2022-11-23T06:31:30","slug":"2012-2","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2012-2\/","title":{"rendered":"2012"},"content":{"rendered":"<h1>2012 Photo Contest Winners<\/h1>\n<table border=\"1\" width=\"700\" cellspacing=\"0\" cellpadding=\"1\">\n<tbody>\n<tr>\n<td class=\"title\" style=\"width: 598px;\" colspan=\"2\" height=\"61\"><strong>Congratulations to the 2012 winners!<\/strong><\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td style=\"width: 598px;\" colspan=\"2\" height=\"20\"><a id=\"color\" name=\"color\"><\/a>\u00a0<strong>Category I: Color Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td class=\"place_text\" style=\"width: 211px;\" valign=\"top\"><strong>1st Place:<\/strong><\/p>\n<div align=\"center\"><img decoding=\"async\" style=\"width: 229px; height: 195px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/Color1.jpg\" alt=\"\" \/><\/div>\n<p align=\"center\">Yann Weber<br \/>\nFreescale Semiconducteurs SAS<\/p>\n<p style=\"text-align: center;\">\n<\/td>\n<td class=\"lessontitle\" style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 299px; height: 195px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/Color2.jpg\" alt=\"\" \/><\/p>\n<p>Ken Turner<br \/>\nHi-Rel Laboratories<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\"><strong>3rd Place:\u00a0<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 299px; height: 199px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/Color3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Jianxiong Chen<br \/>\nNokia Siemens Networks<\/p>\n<p style=\"text-align: center;\">\n<p>&nbsp;<\/td>\n<td style=\"width: 387px;\">\n<p align=\"center\">\n<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td style=\"width: 598px;\" colspan=\"2\"><a id=\"bw\" name=\"bw\"><\/a><strong>\u00a0<\/strong><strong>Category II: Black and White Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\">\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 300px; height: 276px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/BW1.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">\n<p style=\"text-align: center;\">Chad Rue<br \/>\nFEI Company<\/p>\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><strong>\u00a0<\/strong><\/p>\n<p>&nbsp;<\/p>\n<p><img decoding=\"async\" style=\"width: 300px; height: 276px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/BW2.jpg\" alt=\"\" \/><\/p>\n<p>Davide Caccialanza<br \/>\nSTMicroelectronics<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:<\/strong><\/p>\n<p style=\"text-align: center;\">\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 300px; height: 203px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/BW3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Susanne H\u00fcbner<br \/>\nFraunhofer Institute for Mechanics of Materials<\/p>\n<p>&nbsp;<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\"><\/div>\n<div align=\"center\"><\/div>\n<div align=\"center\"><\/div>\n<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td class=\"blue_borderbottom\" style=\"width: 598px;\" colspan=\"2\"><a id=\"false\" name=\"false\"><\/a><strong>\u00a0<\/strong><strong>Category III: False Color Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 299px; height: 257px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/False1.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">\n<p style=\"text-align: center;\">Yann Weber<br \/>\nFreescale Semiconducteurs SAS<\/p>\n<p>&nbsp;<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 300px; height: 259px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/False2.jpg\" alt=\"\" \/><\/p>\n<p>Julien Goxe<br \/>\nFreescale Semiconducteurs France SAS<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:<\/strong><\/p>\n<p style=\"text-align: center;\">\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 266px; height: 230px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/False3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Frank Altmann<br \/>\nFraunhofer Institute for Mechanics of Materials<\/p>\n<p>&nbsp;<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\"><\/div>\n<div align=\"center\"><\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>2012 Photo Contest Winners Congratulations to the 2012 winners! \u00a0Category I: Color Images 1st Place: Yann Weber Freescale Semiconducteurs SAS 2nd Place: Ken Turner Hi-Rel Laboratories 3rd Place:\u00a0 Jianxiong Chen Nokia Siemens Networks &nbsp; \u00a0Category II: Black and White Images 1st Place: Chad Rue FEI Company 2nd Place:\u00a0 &nbsp; Davide Caccialanza STMicroelectronics 3rd Place: Susanne&#8230; <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2012-2\/\">View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":1297,"menu_order":22,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-128","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>2012 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2012-2\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2012 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2012 Photo Contest Winners Congratulations to the 2012 winners! \u00a0Category I: Color Images 1st Place: Yann Weber Freescale Semiconducteurs SAS 2nd Place: Ken Turner Hi-Rel Laboratories 3rd Place:\u00a0 Jianxiong Chen Nokia Siemens Networks &nbsp; 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