{"id":1297,"date":"2022-11-23T06:00:31","date_gmt":"2022-11-23T06:00:31","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/?page_id=1297"},"modified":"2026-09-04T20:30:46","modified_gmt":"2026-09-04T20:30:46","slug":"photo-contest","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/","title":{"rendered":"Photo Contest"},"content":{"rendered":"

Photo Contest<\/h1>\n

OPEN TO ALL MEMBERS OF THE FAILURE ANALYSIS COMMUNITY!<\/p>\n

Share your best images with the failure analysis community and be recognized for creating them!
\nSponsored by the Membership Committee of the Electronic Device Failure Analysis Society<\/a>.<\/p>\n

Where:<\/strong> Selected entries will be displayed and prizes awarded at the 51st International Symposium for Testing and Failure Analysis (ISTFA) Conference and Exposition in Pasadena, CA, USA.<\/p>\n

Categories:<\/strong> No more than one image per person allowed in each category<\/p>\n

    \n
  1. Color Images Only (Optical Microscopy)<\/li>\n
  2. Black & White Images Only (Optical Microscopy\/SEM\/TEM\/X- Ray\/UV Micrographs\/Other)<\/li>\n
  3. False Color Images Only (SPM\/SAM\/Photon Emission\/Other<\/li>\n<\/ol>\n

    Images will be judged on failure analysis relevance (35%), aesthetics (35%), and novelty of the technique or mechanism (30%).<\/p>\n

    Deadline: October 4, 2025<\/strong><\/p>\n

    Entries:<\/strong> Submit by e-mail to\u00a0photocontest@asminternational.org<\/strong><\/a>\u00a0(subject line: EDFAS Photo Contest).<\/p>\n

    Format:<\/strong> Submissions should be made through e-mail only, with one picture attached. Preferred submission is a .jpg or .tif, five inches wide at 300 dpi resolution. Please provide your highest resolution image.<\/p>\n

    Along with the picture, the e-mail should include the name of the submitter, category of submission, mailing address, phone, fax, e-mail address, and a description of the micrograph (not exceeding 50 words). The picture should not have any contact information embedded.<\/p>\n

    Copyright & Permissions:<\/strong> Entrants are responsible for obtaining any releases or any other permission or license necessary for the submission of their work for this contest and future publication. EDFAS and ASM International will have the right to exhibit, reproduce, and distribute in any manner any or all of the entries. The entries will not be returned to the submitters.<\/p>\n

    Prizes:
    \n<\/strong>1st place in each category receives a wall plaque and complimentary registration to ISTFA 2026.
    \n2nd in each category receive award certificates and a $25 gift certificate.
    \n3rd places in each category receive award certificates.<\/p>\n

    Top 10 entries in each category will be displayed at ISTFA 2025.<\/p>\n","protected":false},"excerpt":{"rendered":"

    Photo Contest OPEN TO ALL MEMBERS OF THE FAILURE ANALYSIS COMMUNITY! Share your best images with the failure analysis community and be recognized for creating them! Sponsored by the Membership Committee of the Electronic Device Failure Analysis Society. Where: Selected entries will be displayed and prizes awarded at the 51st International Symposium for Testing and… View Article<\/a><\/p>\n","protected":false},"author":61812,"featured_media":0,"parent":38,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-1297","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\nPhoto Contest - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Photo Contest - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Photo Contest OPEN TO ALL MEMBERS OF THE FAILURE ANALYSIS COMMUNITY! 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