{"id":1303,"date":"2022-11-23T06:15:58","date_gmt":"2022-11-23T06:15:58","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/?page_id=1303"},"modified":"2022-11-23T06:29:42","modified_gmt":"2022-11-23T06:29:42","slug":"2014-2","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2014-2\/","title":{"rendered":"2014"},"content":{"rendered":"
\n\n\n\n\n\n\n\n\n\n\n\n\n
\n

2014 Photo Contest Winners<\/h1>\n

 <\/p>\n

Congratulations to the 2014 winners!<\/strong><\/p>\n

 <\/td>\n<\/tr>\n

<\/a>\u00a0Category I: Color Images<\/strong><\/td>\n<\/tr>\n
1st Place:<\/strong><\/p>\n
\"\"<\/div>\n

 <\/p>\n

Gadi Matushansky, TechInsights<\/td>\n

\n
\n

2nd Place:<\/strong><\/p>\n

\"\"
\nYann WEBER, Freescale Semiconductors SAS<\/p>\n<\/div>\n<\/td>\n<\/tr>\n

3rd Place:\u00a0<\/strong><\/p>\n

 <\/p>\n

\"\"<\/p>\n

Jin Won Koh, National Nanofab Center<\/td>\n

\n

\n<\/td>\n<\/tr>\n

<\/a>\u00a0<\/strong>Category II: Black and White Images<\/strong><\/td>\n<\/tr>\n
\n

1st Place:<\/strong><\/p>\n

\"\"<\/p>\n

Kristopher D Staller, Texas Instruments<\/td>\n

\n
\n

2nd Place:<\/strong>\u00a0<\/strong><\/p>\n

 <\/p>\n

\"\"<\/p>\n

Jay Kopycinski, Freescale Semiconductor<\/p>\n<\/div>\n<\/td>\n<\/tr>\n

\n

3rd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Karl Villareal and Geert Van Huffel, ON Semiconductor<\/td>\n

\n
<\/div>\n<\/td>\n<\/tr>\n
<\/a>\u00a0<\/strong>Category III: False Color Images<\/strong><\/td>\n<\/tr>\n
\n

1st Place:<\/strong><\/p>\n

\"\"<\/p>\n

Yann WEBER, Freescale Semiconductors SAS<\/p>\n<\/td>\n

\n
\n

2nd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Phoumra Tan, Xilinx Inc.<\/p>\n

Allen Gu, Carl Zeiss X-ray Microscopy<\/p>\n<\/div>\n<\/td>\n<\/tr>\n

\n

3rd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Lina Gunawa, TechInsights<\/td>\n

\n
<\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

 <\/p>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

2014 Photo Contest Winners   Congratulations to the 2014 winners!   \u00a0Category I: Color Images 1st Place:   Gadi Matushansky, TechInsights 2nd Place: Yann WEBER, Freescale Semiconductors SAS 3rd Place:\u00a0   Jin Won Koh, National Nanofab Center \u00a0Category II: Black and White Images 1st Place: Kristopher D Staller, Texas Instruments 2nd Place:\u00a0   Jay Kopycinski,… View Article<\/a><\/p>\n","protected":false},"author":61812,"featured_media":0,"parent":1297,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-1303","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\n2014 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2014-2\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2014 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2014 Photo Contest Winners   Congratulations to the 2014 winners!   \u00a0Category I: Color Images 1st Place:   Gadi Matushansky, TechInsights 2nd Place: Yann WEBER, Freescale Semiconductors SAS 3rd Place:\u00a0   Jin Won Koh, National Nanofab Center \u00a0Category II: Black and White Images 1st Place: Kristopher D Staller, Texas Instruments 2nd Place:\u00a0   Jay Kopycinski,... 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