{"id":133,"date":"2014-06-03T16:59:51","date_gmt":"2014-06-03T16:59:51","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/2018_photo\/2007-2\/"},"modified":"2022-11-23T06:33:24","modified_gmt":"2022-11-23T06:33:24","slug":"2007-2","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2007-2\/","title":{"rendered":"2007"},"content":{"rendered":"<h1>2007 Photo Contest Winners<\/h1>\n<table border=\"1\" width=\"700\" cellspacing=\"0\" cellpadding=\"1\">\n<tbody>\n<tr>\n<td class=\"title\" style=\"width: 598px;\" colspan=\"2\" height=\"61\"><strong>Congratulations to the 2007 winners!<\/strong><\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td style=\"width: 598px;\" colspan=\"2\" height=\"20\"><a id=\"color\" name=\"color\"><\/a>\u00a0<strong>Category I: Color Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td class=\"place_text\" style=\"width: 211px;\" valign=\"top\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 200px; height: 226px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/Color1 %281%29.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Becky L. Thompson<br \/>\nIntel Corp<\/p>\n<p>It is a Flip Chip bump crack with fluorescent dye<\/td>\n<td class=\"lessontitle\" style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 200px; height: 167px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/Color2.jpg\" alt=\"\" \/><br \/>\nBill Morrow<\/p>\n<p>MEFAS, Inc.<\/p>\n<p>This is a differential interference contrast<br \/>\n(DIC) image of decapsulated part which<br \/>\nhad popcorn delamination and<br \/>\nsubsequent EOS from shorts. The<br \/>\ndemarcation of the crack is visible with<br \/>\nEOS visible on the lower half which<br \/>\nis below the focal plane.<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\"><strong>3rd Place:\u00a0<\/strong><\/p>\n<p style=\"text-align: center;\"><strong><img decoding=\"async\" style=\"width: 200px; height: 137px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/Color3.jpg\" alt=\"\" \/><\/strong><\/p>\n<p style=\"text-align: center;\">Sang Ah Kim<\/p>\n<p>QRT Semiconductor<\/p>\n<p>The photo is a copper dendrite growth on fuse boxes of a memory device after Highly Accelerated Temperature and Humidity<br \/>\nStress Test.<\/td>\n<td style=\"width: 387px;\">\n<p align=\"center\">\n<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td style=\"width: 598px;\" colspan=\"2\"><a id=\"bw\" name=\"bw\"><\/a><strong>\u00a0<\/strong><strong>Category II: Black and White Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 200px; height: 146px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/BW1.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Hoang-Yen To<\/p>\n<p>Texas Instruments<\/p>\n<p>This is SEM image with PVC and tilted 35 degrees. Device failed all addresses at Bit 34 of a 64-bit word, in all sectors of the flash. The logic component that has the leaky gate is the Enable signal of the buffer that<br \/>\npasses data from 64-bit Flash Bus of Bit34 to 32-bit Arm Bus.<\/p>\n<p style=\"text-align: center;\">\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><strong>\u00a0<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 200px; height: 147px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/BW2.jpg\" alt=\"\" \/><\/p>\n<p>Vassilios Danginis<\/p>\n<p>SMSC<\/p>\n<p>X-ray of an LED {This is an X-ray photo<br \/>\nof an LED. The sample was inspected<br \/>\nusing 2D and 3D using an X-Tek<br \/>\nequipment and a CT imaging}\n<\/p><\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 200px; height: 156px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/BW3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Sue Brown<\/p>\n<p>Semiconductor Insights<\/p>\n<p>Dendrites on a bond wire.<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\"><\/div>\n<div align=\"center\"><\/div>\n<div align=\"center\"><\/div>\n<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td class=\"blue_borderbottom\" style=\"width: 598px;\" colspan=\"2\"><a id=\"false\" name=\"false\"><\/a><strong>\u00a0<\/strong><strong>Category III: False Color Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 200px; height: 186px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/FC1.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">False Color Images<br \/>\n1st Place: Rafael Huerta and Zachary Gemmill<\/p>\n<p>National Semiconductor<\/p>\n<p>EBIC image of an analog device showing emitter leakage on an NPN transistor.<\/p>\n<p style=\"text-align: center;\">\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 200px; height: 187px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/FC2.jpg\" alt=\"\" \/><\/p>\n<p>Dr. Dan Sullivan<\/p>\n<p>Novalux, Inc.<\/p>\n<p>Tennis ball, Big Mac, Whopper, and Pac<br \/>\nMan. IR emission images of VECSEL<br \/>\nlasers. The line observed<br \/>\nare dark line defects.<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 200px; height: 201px;\" src=\"\/app\/uploads\/sites\/41\/files\/17848646\/FC3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Damon Rachell<\/p>\n<p>MEFAS Inc<\/p>\n<p>&#8220;Poly Hotdogs&#8221;<br \/>\nThe entry consists of an IR emissivity image of four poly strain gauges on a diaphragm viewed at 80\u00baC.\u00a0 Each of the gauges shows variations in emissivity, indicating possible differences in the gauges&#8217; attachment to the diaphragm or possible material variations within the gauges themselves.<\/p>\n<p style=\"text-align: center;\">\n<p>&nbsp;<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\"><\/div>\n<div align=\"center\"><\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>2007 Photo Contest Winners Congratulations to the 2007 winners! \u00a0Category I: Color Images 1st Place: Becky L. Thompson Intel Corp It is a Flip Chip bump crack with fluorescent dye 2nd Place: Bill Morrow MEFAS, Inc. This is a differential interference contrast (DIC) image of decapsulated part which had popcorn delamination and subsequent EOS from&#8230; <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2007-2\/\">View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":1297,"menu_order":77,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-133","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>2007 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2007-2\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2007 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2007 Photo Contest Winners Congratulations to the 2007 winners! \u00a0Category I: Color Images 1st Place: Becky L. 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