{"id":38,"date":"2014-06-02T16:16:55","date_gmt":"2014-06-02T16:16:55","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/events\/"},"modified":"2026-10-29T19:46:51","modified_gmt":"2026-10-29T19:46:51","slug":"events","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/","title":{"rendered":"Events"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"38\" class=\"elementor elementor-38\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-473e40b elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"473e40b\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-106ff89\" data-id=\"106ff89\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-3a544d1d elementor-widget elementor-widget-text-editor\" data-id=\"3a544d1d\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"19246911\" data-analytics-asset-title=\"Events\" data-analytics-asset-type=\"web-content\"><h1>Upcoming Events<\/h1><p><a href=\"https:\/\/www.asminternational.org\/imat-event\/\"><img fetchpriority=\"high\" decoding=\"async\" class=\"aligncenter\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/2025\/07\/IMAT2025_Logo_Horizontal_Tagline_Orange-scaled.webp\" alt=\"IMAT2025_Logo_Horizontal_Tagline_Orange\" width=\"413\" height=\"156\" \/><\/a><\/p><div class=\"elementor-element elementor-element-409dfe0 elementor-widget elementor-widget-text-editor\" data-id=\"409dfe0\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><h3 style=\"text-align: center\">IMAT 2027<\/h3><\/div><\/div><div class=\"elementor-element elementor-element-8e2e3d7 elementor-widget elementor-widget-text-editor\" data-id=\"8e2e3d7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p style=\"text-align: center\">October 4-7, 2027<br \/>Columbus, Ohio<\/p><\/div><\/div><br \/><div class=\"elementor-element elementor-element-062d65e elementor-widget elementor-widget-text-editor\" data-id=\"062d65e\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\">\u00a0<\/div><\/div><div class=\"elementor-element elementor-element-0e6dc35 elementor-widget elementor-widget-text-editor\" data-id=\"0e6dc35\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p style=\"text-align: center\"><a href=\"https:\/\/www.asminternational.org\/istfa-event\/future-istfa\/\"><img decoding=\"async\" class=\"alignnone\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/2026\/08\/ISTFA-2027-Upcoming-Events.avif\" alt=\"ISTFA 2027 Upcoming Events\" width=\"409\" height=\"171\" \/><\/a><\/p><p>\u00a0<\/p><\/div><\/div><div class=\"elementor-element elementor-element-1321017 elementor-widget elementor-widget-text-editor\" data-id=\"1321017\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><h3 style=\"text-align: center\">ISTFA 2027<\/h3><\/div><\/div><div class=\"elementor-element elementor-element-d9b3eb7 elementor-widget elementor-widget-text-editor\" data-id=\"d9b3eb7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p style=\"text-align: center\">October 31 \u2013 November 4, 2027<br \/>Phoenix, Arizona<\/p><p>\u00a0<\/p><\/div><\/div><p><img decoding=\"async\" class=\"aligncenter\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/2025\/07\/IMAT2025_Logo_Horizontal_Tagline_Orange-scaled.webp\" alt=\"IMAT2025_Logo_Horizontal_Tagline_Orange\" width=\"421\" height=\"159\" \/><\/p><div class=\"elementor-element elementor-element-559c2b8 elementor-widget elementor-widget-text-editor\" data-id=\"559c2b8\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><h3 style=\"text-align: center\">IMAT 2028<\/h3><\/div><\/div><div class=\"elementor-element elementor-element-d939cda elementor-widget elementor-widget-text-editor\" data-id=\"d939cda\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p style=\"text-align: center\">September 11 \u2013 14, 2028<br \/>New Orleans, Louisiana<\/p><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t<div class=\"elementor-element elementor-element-2d20845 e-flex e-con-boxed e-con e-parent\" data-id=\"2d20845\" data-element_type=\"container\" data-e-type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-48092c4 elementor-widget elementor-widget-text-editor\" data-id=\"48092c4\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<h2 style=\"text-align: center\"><span style=\"color: #0000cd\"><strong>CONGRATULATIONS ISTFA 2025 AWARD WINNERS!<\/strong><\/span><\/h2><p style=\"text-align: center\"><strong>2025 Best Paper (First Place)<\/strong><br \/><strong>Towards in situ failure analysis of multi-layer ceramic capacitors using x-ray nano-laminography<\/strong><\/p><p style=\"text-align: center\">Dr. Till Dreier, Dr. Jenny Romell, Dr. Julius H\u00e5llstedt<\/p><p style=\"text-align: center\"><strong>Session: System in Package and 3D Devices<\/strong><br \/><strong>Presenting Author: Dr. Till Dreier, Excillum AB<\/strong><\/p><p style=\"text-align: center\"><strong>2025 Outstanding Paper (Second Place)<\/strong><br \/><strong>Advancement Towards FIB Active Auto Thinning (AAT) Process<\/strong><\/p><p style=\"text-align: center\">Dr. Sang Hoon Lee, PhD, Dr. Xue Rui, PhD, Dr. Ning Lu, PhD, Mr. John Pittman, Dr. Qiang Jin, PhD, Mr. Joel Lebret, Mr. Robert Gifford, Mr. Tyler Lenzi, Mr. Jaroslav St\u00e1rek, Mr. Viktor \u0160v\u00e9da, Mr. Luk\u00e1\u0161 H\u00fcbner, Mr. Jakub Korgo, Dr. Zhen Lian, PhD, Mr. Gabriel Woodworth, Mr. Davin Fast and Ms. Anne Kenslea, Micron Technology, Boise, ID, Thermo Fisher Scientific, Brno, Jihomoravsk\u00fd kraj, Czech Republic, Thermo Fisher Scientific, Hillsboro, OR<\/p><p style=\"text-align: center\"><strong>Session: FIB Sample Preparation II<\/strong><br \/><strong>Presenting Author: Dr. Sang Hoon Lee, PhD, Micron Technology<\/strong><\/p><p style=\"text-align: center\"><strong>2025 Best Poster (First Place)<\/strong><br \/><strong>Emerging FA Techniques and Concepts \u2013 Open Failure LiT Localization Using Radio Frequency and Amplitude Modulation<\/strong><\/p><p style=\"text-align: center\">Mr. Khristopherson C. Cajucom and Mr. Win T. Tun, Failure Analysis, Analog Devices Inc San Jose, California, San Jose, CA<\/p><p style=\"text-align: center\"><strong>Presenting Author: Mr. Khristopherson C. Cajucom, Analog Devices Inc.<\/strong><\/p><p style=\"text-align: center\"><strong>2025 Outstanding Poster (Second Place)<\/strong><br \/><strong>Microscopy Analysis and Material Characterization \u2013 ECCI imaging of epitaxial GaN with conventional FE-SEM<\/strong><\/p><p style=\"text-align: center\">Ms. Hyun Hwa Kim, Mr. Greg Johnson and Dr. Thomas Rodgers, Electronics Sector, Carl Zeiss Microscopy, Oberkochen, Oberkochen, Germany, Electronics Sector, Carl Zeiss Microscopy, Poughkeepsie, OH, Electronics Sector, Carl Zeiss Microscopy, Oberkochen, NY, Germany<\/p><p style=\"text-align: center\"><strong>Presenting Author: Ms. Hyun Hwa Kim, Carl Zeiss Microscopy<\/strong><\/p><p style=\"text-align: center\"><strong>2025 Video Contest Winner<\/strong><br \/><strong>ZEISS Crossbeam Automatic TEM Sample Preparation<\/strong><\/p><p style=\"text-align: center\">Dr. Heiko Stegmann, Business Sector Electronics, Carl Zeiss Microscopy GmbH, Oberkochen, Germany<\/p><p style=\"text-align: center\"><strong>2025 Student Poster Contest Winner<\/strong><\/p><p style=\"text-align: center\"><strong>First Place Winner<\/strong><br \/><strong>Deposit-Induced Corrosion of a Ni-based Superalloy<\/strong><\/p><p style=\"text-align: center\">Billy Li, Department of Chemical and Materials Engineering, California State Polytechnic University, Pomona, Pomona, CA<\/p><p style=\"text-align: center\"><strong>Second Place Winner<\/strong><br \/><strong>Pack Aluminizing of Selected Austenitic Stainless Steels<\/strong><\/p><p style=\"text-align: center\">Jocasta Do, Department of Chemical and Materials Engineering, California State Polytechnic University, Pomona, Pomona, CA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Upcoming Events IMAT 2027 October 4-7, 2027Columbus, Ohio \u00a0 \u00a0 ISTFA 2027 October 31 \u2013 November 4, 2027Phoenix, Arizona \u00a0 IMAT 2028 September 11 \u2013 14, 2028New Orleans, Louisiana CONGRATULATIONS ISTFA 2025 AWARD WINNERS! 2025 Best Paper (First Place)Towards in situ failure analysis of multi-layer ceramic capacitors using x-ray nano-laminography Dr. Till Dreier, Dr. Jenny&#8230; <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/\">View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-38","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Events - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Events - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Upcoming Events IMAT 2027 October 4-7, 2027Columbus, Ohio \u00a0 \u00a0 ISTFA 2027 October 31 \u2013 November 4, 2027Phoenix, Arizona \u00a0 IMAT 2028 September 11 \u2013 14, 2028New Orleans, Louisiana CONGRATULATIONS ISTFA 2025 AWARD WINNERS! 2025 Best Paper (First Place)Towards in situ failure analysis of multi-layer ceramic capacitors using x-ray nano-laminography Dr. Till Dreier, Dr. Jenny... 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