{"id":64,"date":"2015-12-08T19:27:37","date_gmt":"2015-12-08T19:27:37","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/2015-photo-contest-winners\/"},"modified":"2022-11-23T06:03:46","modified_gmt":"2022-11-23T06:03:46","slug":"2015-2","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2015-2\/","title":{"rendered":"2015"},"content":{"rendered":"\n\n\n\n\n\n\n\n\n\n\n\n
\n

2015 Photo Contest Winners<\/h1>\n

 <\/p>\n

Congratulations to this year’s winners!<\/strong><\/p>\n

 <\/td>\n<\/tr>\n

<\/a>\u00a0Category I: Color Images<\/strong><\/td>\n<\/tr>\n
\n

1st Place:<\/strong><\/p>\n

\"\"<\/div>\n

Michael Woo<\/p>\n

Raytheon Failure Analysis Lab<\/p>\n<\/td>\n

\n
\n

2nd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Joseph Ziebarth<\/p>\n

IM Flash Technologies, LLC<\/p>\n<\/div>\n<\/td>\n<\/tr>\n

\n

3rd Place:\u00a0<\/strong><\/p>\n

\"\"<\/p>\n

Martin Serrano<\/p>\n

Raytheon Failure Analysis Lab<\/p>\n<\/td>\n

\n

\n<\/td>\n<\/tr>\n

<\/a>\u00a0<\/strong>Category II: Black and White Images<\/strong><\/td>\n<\/tr>\n
\n

1st Place:<\/strong><\/p>\n

\"\"<\/p>\n

Noel Forrette<\/p>\n

IM Flash Technologies, LLC<\/p>\n<\/td>\n

\n
\n

2nd Place:<\/strong>\u00a0<\/strong><\/p>\n

\"\"<\/p>\n

Luigi Aranda<\/p>\n

Raytheon Failure Analysis Lab<\/p>\n<\/div>\n<\/td>\n<\/tr>\n

\n

3rd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Rony R. Celetaria<\/p>\n

Analog Devices Gen. Trias, Inc.<\/p>\n<\/td>\n

\n
<\/div>\n<\/td>\n<\/tr>\n
<\/a>\u00a0<\/strong>Category III: False Color Images<\/strong><\/td>\n<\/tr>\n
\n

1st Place:<\/strong><\/p>\n

\"\"<\/p>\n

Mark Kimball<\/p>\n

Maxim Integrated Circuits<\/p>\n<\/td>\n

\n
\n

2nd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Andrew Ozaeta<\/p>\n

Raytheon Failure Analysis Lab<\/p>\n<\/div>\n<\/td>\n<\/tr>\n

\n

3rd Place:<\/strong><\/p>\n

\"\"<\/p>\n

Debra L Yencho<\/p>\n

Texas Instruments<\/p>\n<\/td>\n

\n
<\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

2015 Photo Contest Winners   Congratulations to this year’s winners!   \u00a0Category I: Color Images 1st Place: Michael Woo Raytheon Failure Analysis Lab 2nd Place: Joseph Ziebarth IM Flash Technologies, LLC 3rd Place:\u00a0 Martin Serrano Raytheon Failure Analysis Lab \u00a0Category II: Black and White Images 1st Place: Noel Forrette IM Flash Technologies, LLC 2nd Place:\u00a0… View Article<\/a><\/p>\n","protected":false},"author":59486,"featured_media":0,"parent":1297,"menu_order":9,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-64","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\n2015 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2015-2\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2015 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2015 Photo Contest Winners   Congratulations to this year’s winners!   \u00a0Category I: Color Images 1st Place: Michael Woo Raytheon Failure Analysis Lab 2nd Place: Joseph Ziebarth IM Flash Technologies, LLC 3rd Place:\u00a0 Martin Serrano Raytheon Failure Analysis Lab \u00a0Category II: Black and White Images 1st Place: Noel Forrette IM Flash Technologies, LLC 2nd Place:\u00a0... 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