{"id":6581,"date":"2023-03-28T18:48:07","date_gmt":"2023-03-28T18:48:07","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/?page_id=6581"},"modified":"2026-09-04T20:35:29","modified_gmt":"2026-09-04T20:35:29","slug":"2022_photo","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2022_photo\/","title":{"rendered":"2022"},"content":{"rendered":"

2022\u00a0Photo Winners<\/strong><\/h2>\n

Congratulations to this year’s winners!<\/p>\n

Category I: Color Images
\n1st Place:<\/strong>\u00a0 Stephen Fasolino\u00a0,\u00a0McKinney Failure Analysis Lab<\/em><\/p>\n

\"\"
\n2nd Place:<\/strong>\u00a0 \u00a0Jonelle Mananguit,\u00a0Analog Devices<\/em>
\n3rd Place:<\/strong>\u00a0 \u00a0Djemel Lellouchi, ELEMCA<\/i><\/p>\n

 <\/p>\n

Category II: Black and White Images
\n1st Place:\u00a0<\/strong> Joshua Chang,\u00a0Micron<\/em><\/p>\n

\"\"
\n2nd Place:\u00a0\u00a0<\/strong>Kevin Awai,\u00a0Raytheon Intelligence & Space<\/em>
\n3rd Place:<\/strong>\u00a0 \u00a0Audrey Garnier,\u00a0McKinney Failure Analysis Lab<\/em><\/p>\n

 <\/p>\n

Category III: False Color
\n1st Place:\u00a0\u00a0<\/strong>Wentao Qin,\u00a0ON Semiconductor<\/em><\/p>\n

\"\"
\n2nd Place:\u00a0\u00a0<\/strong>Djemel Lellouchi, ELEMCA<\/i>
\n3rd Place:<\/strong>\u00a0\u00a0Pauli Kehayias<\/p>\n

 <\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

2022\u00a0Photo Winners Congratulations to this year’s winners! Category I: Color Images 1st Place:\u00a0 Stephen Fasolino\u00a0,\u00a0McKinney Failure Analysis Lab 2nd Place:\u00a0 \u00a0Jonelle Mananguit,\u00a0Analog Devices 3rd Place:\u00a0 \u00a0Djemel Lellouchi, ELEMCA   Category II: Black and White Images 1st Place:\u00a0 Joshua Chang,\u00a0Micron 2nd Place:\u00a0\u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space 3rd Place:\u00a0 \u00a0Audrey Garnier,\u00a0McKinney Failure Analysis Lab   Category III:… View Article<\/a><\/p>\n","protected":false},"author":63092,"featured_media":0,"parent":1297,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"page-top-left.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-6581","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\n2022 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2022_photo\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2022 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2022\u00a0Photo Winners Congratulations to this year’s winners! Category I: Color Images 1st Place:\u00a0 Stephen Fasolino\u00a0,\u00a0McKinney Failure Analysis Lab 2nd Place:\u00a0 \u00a0Jonelle Mananguit,\u00a0Analog Devices 3rd Place:\u00a0 \u00a0Djemel Lellouchi, ELEMCA   Category II: Black and White Images 1st Place:\u00a0 Joshua Chang,\u00a0Micron 2nd Place:\u00a0\u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space 3rd Place:\u00a0 \u00a0Audrey Garnier,\u00a0McKinney Failure Analysis Lab   Category III:... 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