{"id":6583,"date":"2023-03-28T18:49:47","date_gmt":"2023-03-28T18:49:47","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/?page_id=6583"},"modified":"2023-03-28T18:55:19","modified_gmt":"2023-03-28T18:55:19","slug":"2021-2","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/","title":{"rendered":"2021"},"content":{"rendered":"

2021 Photo Winners<\/strong><\/h2>\n

Congratulations to this year’s winners!<\/p>\n

Category I: Color Images
\n1st Place:<\/strong>\u00a0 \u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space<\/em><\/p>\n

\"\"
\n2nd Place:<\/strong>\u00a0 \u00a0Joana Marie Q. Kintao,\u00a0Analog Devices<\/em>
\n3rd Place:<\/strong>\u00a0 \u00a0Krizalyn Oligario,\u00a0Analog Devices\u00a0<\/em><\/p>\n

Category II: Black and White Images
\n1st Place:\u00a0\u00a0<\/strong>Wentao Qin,\u00a0ON Semiconductor<\/em><\/p>\n

\"\"
\n2nd Place:\u00a0\u00a0<\/strong>Jason Silva,\u00a0Maxim Integated<\/em>
\n3rd Place:<\/strong>\u00a0 \u00a0Herminso Villarraga-G\u00f3mez,\u00a0Zeiss<\/em><\/p>\n

Category III: False Color
\n1st Place:\u00a0\u00a0<\/strong>Tim Hazeldine,\u00a0<\/strong>Ultratec USA<\/i><\/p>\n

\"\"
\n2nd Place:\u00a0\u00a0<\/strong>Wentao Qin,\u00a0ON Semiconductor<\/em>
\n3rd Place:<\/strong>\u00a0 \u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space<\/em><\/p>\n

 <\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

2021 Photo Winners Congratulations to this year’s winners! Category I: Color Images 1st Place:\u00a0 \u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space 2nd Place:\u00a0 \u00a0Joana Marie Q. Kintao,\u00a0Analog Devices 3rd Place:\u00a0 \u00a0Krizalyn Oligario,\u00a0Analog Devices\u00a0 Category II: Black and White Images 1st Place:\u00a0\u00a0Wentao Qin,\u00a0ON Semiconductor 2nd Place:\u00a0\u00a0Jason Silva,\u00a0Maxim Integated 3rd Place:\u00a0 \u00a0Herminso Villarraga-G\u00f3mez,\u00a0Zeiss Category III: False Color 1st Place:\u00a0\u00a0Tim… View Article<\/a><\/p>\n","protected":false},"author":63092,"featured_media":0,"parent":1297,"menu_order":2,"comment_status":"open","ping_status":"closed","template":"page-top-left.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-6583","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\n2021 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2021 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2021 Photo Winners Congratulations to this year’s winners! Category I: Color Images 1st Place:\u00a0 \u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space 2nd Place:\u00a0 \u00a0Joana Marie Q. Kintao,\u00a0Analog Devices 3rd Place:\u00a0 \u00a0Krizalyn Oligario,\u00a0Analog Devices\u00a0 Category II: Black and White Images 1st Place:\u00a0\u00a0Wentao Qin,\u00a0ON Semiconductor 2nd Place:\u00a0\u00a0Jason Silva,\u00a0Maxim Integated 3rd Place:\u00a0 \u00a0Herminso Villarraga-G\u00f3mez,\u00a0Zeiss Category III: False Color 1st Place:\u00a0\u00a0Tim... View Article\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:modified_time\" content=\"2023-03-28T18:55:19+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2023\/03\/nand-flash_b-KAwai.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"1392\" \/>\n\t<meta property=\"og:image:height\" content=\"1040\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/\",\"name\":\"2021 - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/03\\\/nand-flash_b-KAwai-250x187.jpg\",\"datePublished\":\"2023-03-28T18:49:47+00:00\",\"dateModified\":\"2023-03-28T18:55:19+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/03\\\/nand-flash_b-KAwai-250x187.jpg\",\"contentUrl\":\"https:\\\/\\\/www.asminternational.org\\\/app\\\/uploads\\\/sites\\\/41\\\/2023\\\/03\\\/nand-flash_b-KAwai-250x187.jpg\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/2021-2\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Events\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Photo Contest\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/events\\\/photo-contest\\\/\"},{\"@type\":\"ListItem\",\"position\":4,\"name\":\"2021\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"2021 - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/","og_locale":"en_US","og_type":"article","og_title":"2021 - Electronic Device Failure Analysis Society","og_description":"2021 Photo Winners Congratulations to this year’s winners! Category I: Color Images 1st Place:\u00a0 \u00a0Kevin Awai,\u00a0Raytheon Intelligence & Space 2nd Place:\u00a0 \u00a0Joana Marie Q. Kintao,\u00a0Analog Devices 3rd Place:\u00a0 \u00a0Krizalyn Oligario,\u00a0Analog Devices\u00a0 Category II: Black and White Images 1st Place:\u00a0\u00a0Wentao Qin,\u00a0ON Semiconductor 2nd Place:\u00a0\u00a0Jason Silva,\u00a0Maxim Integated 3rd Place:\u00a0 \u00a0Herminso Villarraga-G\u00f3mez,\u00a0Zeiss Category III: False Color 1st Place:\u00a0\u00a0Tim... View Article","og_url":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/","og_site_name":"Electronic Device Failure Analysis Society","article_modified_time":"2023-03-28T18:55:19+00:00","og_image":[{"width":1392,"height":1040,"url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2023\/03\/nand-flash_b-KAwai.jpg","type":"image\/jpeg"}],"twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/","url":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/","name":"2021 - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/#primaryimage"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/#primaryimage"},"thumbnailUrl":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/03\/nand-flash_b-KAwai-250x187.jpg","datePublished":"2023-03-28T18:49:47+00:00","dateModified":"2023-03-28T18:55:19+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/#primaryimage","url":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/03\/nand-flash_b-KAwai-250x187.jpg","contentUrl":"https:\/\/www.asminternational.org\/app\/uploads\/sites\/41\/2023\/03\/nand-flash_b-KAwai-250x187.jpg"},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2021-2\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Events","item":"https:\/\/www.asminternational.org\/edfas\/events\/"},{"@type":"ListItem","position":3,"name":"Photo Contest","item":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/"},{"@type":"ListItem","position":4,"name":"2021"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/6583","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63092"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=6583"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/6583\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/1297"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=6583"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}