{"id":82,"date":"2015-12-14T14:50:59","date_gmt":"2015-12-14T14:50:59","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/2016-photo-contest-winners\/"},"modified":"2022-11-23T06:01:26","modified_gmt":"2022-11-23T06:01:26","slug":"2016-2","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2016-2\/","title":{"rendered":"2016"},"content":{"rendered":"<table id=\"aui_3_4_0_1_439\" border=\"1\" width=\"700\" cellspacing=\"0\" cellpadding=\"1\">\n<tbody id=\"aui_3_4_0_1_438\">\n<tr id=\"aui_3_4_0_1_437\">\n<td id=\"aui_3_4_0_1_436\" class=\"title\" style=\"width: 598px;\" colspan=\"2\" height=\"61\">\n<h1 id=\"aui_3_4_0_1_435\">2016 Photo Contest Winners<\/h1>\n<p>&nbsp;<\/p>\n<p><strong>Congratulations to this year&#8217;s winners!<\/strong><\/p>\n<p>&nbsp;<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td style=\"width: 598px;\" colspan=\"2\" height=\"20\"><a id=\"color\" name=\"color\"><\/a>\u00a0<strong>Category I: Color Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td class=\"place_text\" style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<div><img decoding=\"async\" style=\"color: #0063b7; font-family: Helvetica, Arial, sans-serif; font-size: 0.8em; line-height: 1.33333em; width: 215px; height: 161px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016CO_1.jpg\" alt=\"\" \/><\/div>\n<p style=\"text-align: center;\">Jordan Hendricks<\/p>\n<p style=\"text-align: center;\">Hi-Rel Laboratories<\/p>\n<\/td>\n<td class=\"lessontitle\" style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 215px; height: 161px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016CO_2.jpg\" alt=\"\" \/><\/p>\n<p>Eric Cattey<\/p>\n<p>NXP Semiconductors<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:\u00a0<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 215px; height: 178px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016CO_3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Richard Park<\/p>\n<p style=\"text-align: center;\">Raytheon<\/p>\n<\/td>\n<td style=\"width: 387px;\">\n<p align=\"center\">\n<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td style=\"width: 598px;\" colspan=\"2\"><a id=\"bw\" name=\"bw\"><\/a><strong>\u00a0<\/strong><strong>Category II: Black and White Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 215px; height: 198px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016BW_1.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Nathan Wang<\/p>\n<p style=\"text-align: center;\">Maxim Integrated<\/p>\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><strong>\u00a0<\/strong><\/p>\n<p><img decoding=\"async\" style=\"width: 215px; height: 161px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016BW_2.jpg\" alt=\"\" \/><\/p>\n<p>Lori Sarnecki<\/p>\n<p>Fairchild Semiconductor<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 215px; height: 215px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016BW_3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Philipp Scholz &amp; Heiko Lohrke<\/p>\n<p style=\"text-align: center;\">Technische Universit\u00e4t Berlin<\/p>\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\"><\/div>\n<\/td>\n<\/tr>\n<tr bgcolor=\"#d09800\">\n<td class=\"blue_borderbottom\" style=\"width: 598px;\" colspan=\"2\"><a id=\"false\" name=\"false\"><\/a><strong>\u00a0<\/strong><strong>Category III: False Color Images<\/strong><\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>1st Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 200px; height: 200px;\" src=\"\/app\/uploads\/files_edfas\/png\/2016FC_1.png\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Wentao Qin<\/p>\n<p style=\"text-align: center;\">ON Semiconductor<\/p>\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\">\n<p><strong>2nd Place:<\/strong><\/p>\n<p><img decoding=\"async\" style=\"font-family: Helvetica, Arial, sans-serif; font-size: 0.8em; line-height: 1.33333em; width: 215px; height: 156px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016FC_2.jpg\" alt=\"\" \/><\/p>\n<p>Luigi L. Aranda<\/p>\n<p>Raytheon<\/p>\n<\/div>\n<\/td>\n<\/tr>\n<tr>\n<td style=\"width: 211px;\" valign=\"top\">\n<p style=\"text-align: center;\"><strong>3rd Place:<\/strong><\/p>\n<p style=\"text-align: center;\"><img decoding=\"async\" style=\"width: 215px; height: 161px;\" src=\"\/app\/uploads\/files_edfas\/jpg\/2016FC_3.jpg\" alt=\"\" \/><\/p>\n<p style=\"text-align: center;\">Andrew Ozaeta<\/p>\n<p style=\"text-align: center;\">Raytheon<\/p>\n<\/td>\n<td style=\"width: 387px;\">\n<div align=\"center\"><\/div>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>2016 Photo Contest Winners &nbsp; Congratulations to this year&#8217;s winners! &nbsp; \u00a0Category I: Color Images 1st Place: Jordan Hendricks Hi-Rel Laboratories 2nd Place: Eric Cattey NXP Semiconductors 3rd Place:\u00a0 Richard Park Raytheon \u00a0Category II: Black and White Images 1st Place: Nathan Wang Maxim Integrated 2nd Place:\u00a0 Lori Sarnecki Fairchild Semiconductor 3rd Place: Philipp Scholz &amp;&#8230; <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2016-2\/\">View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":1297,"menu_order":6,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-82","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>2016 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2016-2\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2016 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2016 Photo Contest Winners &nbsp; Congratulations to this year&#8217;s winners! &nbsp; \u00a0Category I: Color Images 1st Place: Jordan Hendricks Hi-Rel Laboratories 2nd Place: Eric Cattey NXP Semiconductors 3rd Place:\u00a0 Richard Park Raytheon \u00a0Category II: Black and White Images 1st Place: Nathan Wang Maxim Integrated 2nd Place:\u00a0 Lori Sarnecki Fairchild Semiconductor 3rd Place: Philipp Scholz &amp;... 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