{"id":86,"date":"2018-01-10T22:08:48","date_gmt":"2018-01-10T22:08:48","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/2017-photo-winners\/"},"modified":"2023-03-28T19:09:57","modified_gmt":"2023-03-28T19:09:57","slug":"2017_photo","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2017_photo\/","title":{"rendered":"2017"},"content":{"rendered":"

2017 Photo Winners<\/strong><\/h2>\n

Congratulations to this year’s winners!<\/p>\n

 <\/p>\n

Category I: Color Images<\/strong><\/p>\n

1st Place:<\/strong>\u00a0Kevin Awai, Mellanox Technologies<\/em><\/p>\n

<\/p>\n

 <\/p>\n

2nd Place:<\/strong>\u00a0David Jarrett, Hi-Rel Laboratories<\/em><\/p>\n

<\/p>\n

 <\/p>\n

3rd Place:<\/strong>\u00a0Tammy Berger, Naval Surface Warfare Center<\/em><\/p>\n

<\/p>\n

 <\/p>\n

Category II: Black and White Images<\/strong><\/p>\n

1st Place:\u00a0<\/strong>Kah Chin Cheong and\u00a0Hung K. Do, ON Semiconductor<\/em><\/p>\n

<\/p>\n

 <\/p>\n

2nd Place:<\/strong>\u00a0Bence Hevesi, Robert Bosch Kft.<\/em><\/p>\n

<\/p>\n

 <\/p>\n

3rd Place:<\/strong>\u00a0Nathan Wang, Maxim Integrated<\/em><\/p>\n

<\/p>\n

 <\/p>\n

Category III: False Color<\/strong><\/p>\n

1st Place:\u00a0<\/strong>Wentao Qin, ON Semiconductor<\/em><\/p>\n

<\/p>\n

 <\/p>\n

2nd Place:<\/strong>\u00a0Ian Kearney, Mark Dipsey and Bruce Gillette, Texas Instruments<\/em><\/p>\n

<\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

2017 Photo Winners Congratulations to this year’s winners!   Category I: Color Images 1st Place:\u00a0Kevin Awai, Mellanox Technologies   2nd Place:\u00a0David Jarrett, Hi-Rel Laboratories   3rd Place:\u00a0Tammy Berger, Naval Surface Warfare Center   Category II: Black and White Images 1st Place:\u00a0Kah Chin Cheong and\u00a0Hung K. Do, ON Semiconductor   2nd Place:\u00a0Bence Hevesi, Robert Bosch Kft…. View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":1297,"menu_order":6,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-86","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\n2017 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2017_photo\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2017 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2017 Photo Winners Congratulations to this year’s winners!   Category I: Color Images 1st Place:\u00a0Kevin Awai, Mellanox Technologies   2nd Place:\u00a0David Jarrett, Hi-Rel Laboratories   3rd Place:\u00a0Tammy Berger, Naval Surface Warfare Center   Category II: Black and White Images 1st Place:\u00a0Kah Chin Cheong and\u00a0Hung K. 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