{"id":883,"date":"2022-10-18T08:46:37","date_gmt":"2022-10-18T08:46:37","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/asm-videos\/"},"modified":"2023-05-18T00:35:01","modified_gmt":"2023-05-18T00:35:01","slug":"videos","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/videos\/","title":{"rendered":"ASM Videos"},"content":{"rendered":"<div class=\"portlet-body\">\n<form class=\"inPageSearch autoSuggestForm\" id=\"searchWebContentForm\" method=\"get\">\n<div class=\"ipsHeader\">\n<h3><a href=\"#\" class=\"chevron\" style=\"\n    color: #000000;\n\">VIDEO SEARCH<\/a><\/h3>\n<p>\t\t\t\t\t\t\t<input type=\"hidden\" id=\"wkcSearchType\" name=\"searchType\" value=\"video\">\n\t\t\t\t\t\t<\/p>\n<\/div>\n<div class=\"ipsContent clearfix\">\n<div class=\"col-md-7 inside autoSuggest\" id=\"yui_patched_v3_18_1_1_1672152978758_81\" style=\"\n    \/* width: 74%; *\/\n\"><br \/>\n\t\t\t\t\t\t\t\t<span> <input type=\"text\" name=\"_webcontentfilters_WAR_webcontentsearchportlet_keyword\" placeholder=\"e.g. steel\" autocomplete=\"off\" class=\"uniform-input text\" id=\"wkc_news_search_filter\" style=\"height:27px;width: 95%;\" value=\"\"> <\/span>\n\t\t\t\t\t\t\t<\/div>\n<div class=\"col-md-2\"> <a onclick=\"javascript:document.getElementById('searchWebContentForm').submit();return false;\" class=\"buttonSecondary gradient\" href=\"#\"><span class=\"small\">Search<\/span><\/a> <\/div>\n<\/p>\n<\/div>\n<\/form>\n<hr>\n<\/div>\n<div class=\"search-results\">\n<div style=\"display: none;\"><div class=\"facetwp-facet facetwp-facet-post_type facetwp-type-checkboxes\" data-name=\"post_type\" data-type=\"checkboxes\"><\/div><\/div>\n<p><div class=\"facetwp-facet facetwp-facet-result_count facetwp-type-pager\" data-name=\"result_count\" data-type=\"pager\"><\/div><br \/>\n<div class=\"facetwp-facet facetwp-facet-pagination facetwp-type-pager\" data-name=\"pagination\" data-type=\"pager\"><\/div><br \/>\n<div class=\"facetwp-template\" data-name=\"global_search\"><div class=\"fwpl-layout el-3nlyri\"><div class=\"fwpl-result r1\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__USC__400-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__USC__400-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__USC__400-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__USC__400-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/this-new-chip-survives-1300f-700c-and-could-change-ai-forever\/\">This new chip survives 1300\u00b0F (700\u00b0C) and could change AI forever<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: May 13, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Researchers at the University of Southern California have unveiled a new memristor memory device that continues to operate at 700 degrees Celsius (~1300 degrees Fahrenheit), marking it as the most robust high-temperature memory technology ever demonstrated.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r2\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__RiceU__400-1-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__RiceU__400-1-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__RiceU__400-1-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__RiceU__400-1-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/rice-researchers-redefine-electronics-manufacturing-with-focused-microwave-3d-printing\/\">Rice researchers redefine electronics manufacturing with focused microwave 3D printing<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: May 13, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Researchers at Rice University, Houston, Texas, have developed a 3D-printing process that utilizes focused microwaves to selectively heat functional inks, enabling the direct integration of electronics onto temperature-sensitive materials such as biopolymers and living biological tissue without damaging the underlying substrate.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r3\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Camtek__400-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Camtek__400-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Camtek__400-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Camtek__400-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/camtek-acquires-visual-layer-to-deepen-its-visual-ai-capabilities-in-its-inspection-and-metrology-offering\/\">Camtek acquires Visual Layer to deepen its visual AI capabilities in its inspection and metrology offering<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: May 13, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Camtek Ltd., Israel, a leading developer and manufacturer of inspection and metrology equipment for the semiconductor industry, has signed a definitive agreement to acquire Visual Layer, a Tel Aviv-based AI company specializing in visual analytics.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r4\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Osaka__400-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Osaka__400-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Osaka__400-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Osaka__400-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/no-batteries-just-body-heat-demonstrating-the-potential-of-battery-free-sensing\/\">No batteries, just body heat: demonstrating the potential of battery-free sensing<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: May 13, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Researchers at The University of Osaka, Japan, have developed an outdoor wireless EEG transmission system using energy harvested from the temperature difference between the human body and surrounding air, even under hot summer conditions.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r5\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Bruker__400-1-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Bruker__400-1-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Bruker__400-1-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__Bruker__400-1-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/bruker-invests-in-photothermal-afm-ir-to-advance-semiconductor-research\/\">Bruker invests in Photothermal AFM-IR to advance semiconductor research<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: May 13, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Bruker Corporation, Billerica, Mass., announced accelerated development of its photothermal AFM-IR spectroscopy capabilities to address research challenges facing the semiconductor industry as device architectures continue to shrink and systems become increasingly more complex. <\/div><\/div><\/div><\/div><div class=\"fwpl-result r6\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__QuantumDiamonds__400-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__QuantumDiamonds__400-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__QuantumDiamonds__400-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/05\/EDFAS__052126__QuantumDiamonds__400-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/quantumdiamonds-deploys-failure-analysis-technology-at-taiwan-semiconductor-test-house\/\">QuantumDiamonds deploys failure analysis technology at Taiwan semiconductor test house<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: May 13, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">QuantumDiamonds GmbH, Germany, deployed its QDm.1 quantum sensing system at Integrated Service Technology (iST) in Taiwan, marking its first installation in Asia and a step toward adoption in high-volume semiconductor failure analysis.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r7\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__UnivMelbourne__400-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__UnivMelbourne__400-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__UnivMelbourne__400-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__UnivMelbourne__400-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/first-quantum-battery-developed-and-tested-by-australian-researchers\/\">First quantum battery developed and tested by Australian researchers<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: April 17, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Australian scientists at the University of Melbourne have made a significant leap forward in energy storage technology by developing and testing the world\u2019s first proof-of-concept quantum battery.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r8\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Cosmic__400-150x107.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/cosmic-is-born-a-new-global-player-for-semiconductor-test-solutions-built-on-decades-of-experience\/\">Cosmic is born: A new global player for semiconductor test solutions \u2013 built on decades of experience<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: April 17, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Following an international expansion strategy initiated in 2022, a new global semiconductor test solutions group named Cosmic has been formed by uniting specialized industrial companies from Italy, the Netherlands, Germany, the United Kingdom, and the United States into two independent divisions: Cosmic Equipment and Cosmic Services.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r9\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__Applied__400-2-150x125.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/applied-materials-introduces-deposition-systems-for-angstrom-era-logic-chips\/\">Applied Materials introduces deposition systems for Angstrom-era logic chips<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: April 17, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Applied Materials, Santa Clara, Calif., has introduced two new deposition systems\u2014the Precision Selective Nitride PECVD and the Trillium ALD\u2014designed to provide the atomic-level precision necessary for manufacturing the complex 3D Gate-All-Around transistors required for next-generation 2nm logic chips and AI infrastructure.<\/div><\/div><\/div><\/div><div class=\"fwpl-result r10\"><div class=\"fwpl-row el-pj32xg7\"><div class=\"fwpl-col fwpl-col el-t27m1m\"><div class=\"fwpl-item el-amxz9g\"><span class=\"contentIcon bookmark\"><\/span><\/div><\/div><\/div><div class=\"fwpl-row el-px9o1a\"><div class=\"fwpl-col fwpl-col el-0f13hua\"><div class=\"fwpl-item el-ql26l3 post-image\"><img decoding=\"async\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__DOE__400-150x150.webp\" class=\"attachment-thumbnail size-thumbnail wp-post-image\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__DOE__400-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__DOE__400-300x300.webp 300w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__DOE__400-100x100.webp 100w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/04\/EDFAS__042326__DOE__400-32x32.webp 32w\" sizes=\"(max-width: 150px) 100vw, 150px\" \/><\/div><\/div><div class=\"fwpl-col fwpl-col el-t5lw9\"><div class=\"fwpl-item el-40alu post-link\"><a href=\"https:\/\/www.asminternational.org\/edfas\/uncovering-hidden-atomic-patterns-in-semiconductors\/\">Uncovering hidden atomic patterns in semiconductors<\/a><\/div><div class=\"fwpl-item el-86wohq post-date\">Published: April 17, 2026<\/div><div class=\"fwpl-item el-f70p7 my-listing-excerpt\">Advanced microscopy research at the US Department of Energy \u03bc-ATOMS Energy Frontier Research Center reveals motifs of trace atoms in semiconductors, paving the way for new microelectronics designed atom by atom.<\/div><\/div><\/div><\/div><\/div>\n<style>\n.fwpl-layout, .fwpl-row {\n    display: grid;\n}\n.fwpl-layout.el-3nlyri {\n    grid-template-columns: repeat(1, 1fr);\n    grid-gap: 10px;\n}\n.fwpl-btn {\n    text-decoration: none;\n}\n.fwpl-row.el-pj32xg7 {\n    grid-template-columns: 1fr;\n}\n.fwpl-row.el-px9o1a {\n    grid-template-columns: 29.6% 1fr;\n}\n@media (max-width: 480px) { \n    body .facetwp-template .fwpl-layout,  \n    body .facetwp-template-static .fwpl-layout { grid-template-columns: 1fr; } \n} \n\n<\/style>\n<\/div><br \/>\n<div class=\"facetwp-facet facetwp-facet-pagination facetwp-type-pager\" data-name=\"pagination\" data-type=\"pager\"><\/div>\n<\/p><\/div>\n","protected":false},"excerpt":{"rendered":"<p>VIDEO SEARCH Search<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":2,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-883","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with 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Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2022-10-18T08:46:37+00:00\",\"dateModified\":\"2023-05-18T00:35:01+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/videos\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"ASM Videos\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"ASM Videos - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/videos\/","og_locale":"en_US","og_type":"article","og_title":"ASM Videos - Electronic Device Failure Analysis Society","og_description":"VIDEO SEARCH Search","og_url":"https:\/\/www.asminternational.org\/edfas\/videos\/","og_site_name":"Electronic Device Failure Analysis Society","article_modified_time":"2023-05-18T00:35:01+00:00","twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/","url":"https:\/\/www.asminternational.org\/edfas\/videos\/","name":"ASM Videos - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2022-10-18T08:46:37+00:00","dateModified":"2023-05-18T00:35:01+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/videos\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/videos\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/videos\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"ASM Videos"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/883","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=883"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/883\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=883"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}