{"id":91,"date":"2019-10-04T09:13:28","date_gmt":"2019-10-04T09:13:28","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/38474245-2\/"},"modified":"2023-03-28T19:09:20","modified_gmt":"2023-03-28T19:09:20","slug":"2019_photo","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2019_photo\/","title":{"rendered":"2019"},"content":{"rendered":"

2019 Photo Winners<\/strong><\/h1>\n

Congratulations to this year’s winners!<\/strong><\/p>\n

Category I:\u00a0 Color Images<\/p>\n

1st Place:\u00a0 Kevin Awai
\n<\/strong><\/p>\n

2nd Place:\u00a0 Kristopher Staller
\n<\/strong><\/p>\n

3rd Place:\u00a0 Gerald Guibaud
\n<\/strong><\/p>\n

 <\/p>\n

Category II:\u00a0 Black & White<\/strong><\/p>\n

1st Place:\u00a0 Kristof J.P. Jacobs<\/strong>
\n<\/p>\n

2nd Place:\u00a0 Nancy Biro
\n<\/strong><\/p>\n

3rd Place:\u00a0 Ying You Syu
\n<\/strong><\/p>\n

 <\/p>\n

Category III:\u00a0 False Color<\/strong><\/p>\n

1st Place:\u00a0 Juan M. Atkinson Mora
\n<\/strong><\/p>\n

2nd Place:\u00a0 Wentao Qin
\n<\/strong><\/p>\n

3rd Place:\u00a0 Chuan Zhang
\n<\/strong><\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

2019 Photo Winners Congratulations to this year’s winners! Category I:\u00a0 Color Images 1st Place:\u00a0 Kevin Awai 2nd Place:\u00a0 Kristopher Staller 3rd Place:\u00a0 Gerald Guibaud   Category II:\u00a0 Black & White 1st Place:\u00a0 Kristof J.P. Jacobs 2nd Place:\u00a0 Nancy Biro 3rd Place:\u00a0 Ying You Syu   Category III:\u00a0 False Color 1st Place:\u00a0 Juan M. Atkinson Mora… View Article<\/a><\/p>\n","protected":false},"author":3,"featured_media":0,"parent":1297,"menu_order":4,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-91","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\n2019 - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/events\/photo-contest\/2019_photo\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"2019 - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"2019 Photo Winners Congratulations to this year’s winners! 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