{"id":934,"date":"2022-10-18T08:46:38","date_gmt":"2022-10-18T08:46:38","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/events\/istfa-conference-proceedings\/"},"modified":"2023-04-12T18:16:13","modified_gmt":"2023-04-12T18:16:13","slug":"istfa-conference-proceedings","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/istfa-conference-proceedings\/","title":{"rendered":"ISTFA Conference Proceedings"},"content":{"rendered":"\t\t
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ISTFA Proceedings<\/h1>

\"\"<\/a><\/p>

The\u00a0International Symposium for Testing and Failure Analysis<\/strong>\u00a0is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques.<\/p>

EDFAS Proceedings are free to EDFAS Members as part of your member benefit package.<\/p>

View proceedings digitally in the library<\/a><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

ISTFA Proceedings The\u00a0International Symposium for Testing and Failure Analysis\u00a0is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. EDFAS Proceedings are free to EDFAS Members as part of your member benefit package. View proceedings digitally in the library<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-934","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"\nISTFA Conference Proceedings - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/istfa-conference-proceedings\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"ISTFA Conference Proceedings - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"ISTFA Proceedings The\u00a0International Symposium for Testing and Failure Analysis\u00a0is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. EDFAS Proceedings are free to EDFAS Members as part of your member benefit package. 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