{"id":3835,"date":"2019-06-10T16:10:19","date_gmt":"2019-06-10T16:10:19","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/37485205\/NEWS\/"},"modified":"2023-02-07T04:52:41","modified_gmt":"2023-02-07T04:52:41","slug":"nikon-jeol-neoscope-sem-includes-high-vacuum-functionality-for-efficient-analysis","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/37485205\/NEWS\/","title":{"rendered":"Nikon-Jeol NeoScope SEM includes high-vacuum functionality for efficient analysis"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">Nikon Instruments, Melville, N.Y., and Jeol USA, Peabody, Mass., have developed a powerful yet economical benchtop scanning electron microscope: the JCM-6000Plus NeoScope, a touch-panel controlled multifunctional SEM. It is a high-performance system in a compact, innovative model that provides intuitive touch-panel operation with a new graphical user interface.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire contrast information about specimen composition, and enabling efficient analysis. The series continues to include high-vacuum functionality and a secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification. <\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">Secondary electron imaging and backscattered electron imaging are supported at high vacuum. A new high-sensitivity solid state backscattered electron detector provides both composition and topographic imaging information. &nbsp;Dual frame imaging has been added to facilitate comparison of live and retrieved images, as well as a wide magnification range from 10X (for wide area of view) up to 60,000X.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><a href=\"https:\/\/www.microscope.healthcare.nikon.com\/\" target=\"_blank\" rel=\"noopener\">www.NikonInstruments.com<\/a><\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Nikon Instruments, Melville, N.Y., and Jeol USA, Peabody, Mass., have developed a powerful yet economical benchtop scanning electron microscope: the JCM-6000Plus NeoScope, a touch panel controlled multifunctional SEM.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,435,436,1],"tags":[],"class_list":["post-3835","post","type-post","status-publish","format-standard","hentry","category-electronics","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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