{"id":3851,"date":"2019-05-13T11:52:04","date_gmt":"2019-05-13T11:52:04","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/37253573\/NEWS\/"},"modified":"2023-02-07T04:52:43","modified_gmt":"2023-02-07T04:52:43","slug":"oxford-instruments-nanoanalysis-division-wins-queens-award-for-x-ray-detection-system","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/37253573\/NEWS\/","title":{"rendered":"Oxford Instruments NanoAnalysis division wins Queen\u2019s award for X-ray detection system"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">Oxford Instruments, England, announces that its NanoAnalysis division has won the Enterprise 2019 Queen\u2019s Award for the Ultim Extreme detector system which, when used in an electron microscope, enables very low-energy x-rays to be detected in semiconductor samples. Such a capability has multiple applications, including measurement of lithium used in battery research and high-resolution measurements of semiconductor samples.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">This is the sixth Queen\u2019s Award won by the NanoAnalysis division, and the fourteenth for the Oxford Instruments Group overall.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">The unique design of the Ultim Extreme enables very low energy x-rays to be detected in samples in an electron microscope, something previously considered to be very difficult to achieve. Users include some of the most prestigious institutions and businesses from around the world, who are able to dramatically improve their productivity and explore ever more sensitively and expanding their capabilities at the nanoscale.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">Dr. Ian Wilcock, Managing Director NanoAnalysis, commented \u201cI am delighted for the Oxford Instruments team that conceived and developed our unique Extreme detector that their innovation has been recognized by the Queen\u2019s Award. The system has been a great success and is now used in laboratories throughout the world in key areas of research including novel semiconductor applications.&#8221; <\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\"><a href=\"http:\/\/www.oxinst.com\">www.oxinst.com<\/a> <\/span><\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Oxford Instruments, England, announces that its NanoAnalysis division has won the Enterprise 2019 Queen\u2019s Award for the Ultim Extreme detector system which, when used in an electron microscope, enables very low-energy x-rays to be detected in semiconductor samples.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,435,436,1],"tags":[],"class_list":["post-3851","post","type-post","status-publish","format-standard","hentry","category-electronics","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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