{"id":3858,"date":"2019-04-19T15:11:50","date_gmt":"2019-04-19T15:11:50","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/37062238\/NEWS\/"},"modified":"2023-02-07T04:52:43","modified_gmt":"2023-02-07T04:52:43","slug":"leica-user-interface-for-dvm6-microscope-cuts-time-for-2d-3d-scanned-image-acquisition","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/37062238\/NEWS\/","title":{"rendered":"Leica user interface for DVM6 microscope cuts time for 2D\/3D scanned image acquisition"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">Leica Microsystems, Buffalo Grove, Ill., introduces LAS X.next, the new streamlined software user interface for the DVM6 digital microscope. Enabling detailed component analysis. LAS X.next helps save time when acquiring 2D and 3D scanned images, making task-flows clearer, simpler, and intuitive for operators. Together, they facilitate the acquisition of 2D and 3D scanned images in significantly less time. <\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">The interface enables users to do detailed component analysis for R&amp;D, QC, and failure analysis quickly. It guides users through image acquisition, measurements, and report generation, providing an efficient workflow and reliable reproducibility of results. LAS X.next provides a straightforward operation for the DVM6 system for faster completion of work steps. Advantages include fast and intuitive navigation with predefined tasks; reliable results thanks to integrated intelligent algorithms that accelerate the optimization of microscope parameters; and easy acquisition of 2D and 3D images using interactive scan points to quickly define a scan area or volume.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">LAS X.next guides operators through image acquisition, measurement, and reporting, providing an efficient workflow and reliable reproducibility of results. It provides a straightforward operation for the DVM6 system for faster completion of work steps.<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\">Fast and straightforward navigation as predefined task-flows help to reduce complexity, thereby saving time for users with different levels of experience. Assisted image brightness algorithms make it effortless to get the perfect image setting. Interactive scan points to define a scan area or volume enable easy acquisition of 2D and 3D images. It is easy to create a report for 2D and 3D measurements with one click<\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><span style=\"font-size:12.0pt\"><a href=\"https:\/\/www.leica-microsystems.com\/\">https:\/\/www.leica-microsystems.com\/<\/a><\/span><\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Leica Microsystems, Buffalo Grove, Ill., introduces LAS X.next, the new streamlined software user interface for the DVM6 digital microscope.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,435,436,1],"tags":[],"class_list":["post-3858","post","type-post","status-publish","format-standard","hentry","category-electronics","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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