{"id":4085,"date":"2016-09-19T11:11:05","date_gmt":"2016-09-19T11:11:05","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26808329\/NEWS\/"},"modified":"2023-02-07T04:53:00","modified_gmt":"2023-02-07T04:53:00","slug":"optotherm-infrared-camera-based-on-amorphous-silicon-microbolometer-technology","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26808329\/NEWS\/","title":{"rendered":"Optotherm infrared camera based on amorphous silicon microbolometer technology"},"content":{"rendered":"

\n\tOptotherm, Sewickley, Pa., recently developed the IS640 radiometric infrared camera designed for thermographic applications requiring high sensitivity, resolution, and accuracy. Based on new Amorphous Silicon Microbolometer technology with 17?m detector pitch, the IS640 provides unparalleled performance and reliability.<\/p>\n

\n\tHigh 640×480 detector resolution increases field of view, and the 60 Hz image capture rate provides blur-free imaging, improving transient thermal analysis, and increasing the signal-to-noise ratio of Lock-in Thermography tests. A solid anodized aluminum chassis improves thermal uniformity within the camera detector, while optics and electronics facilitate optimum calibration accuracy over the ambient temperature operating range.<\/p>\n

\n\twww.optotherm.com<\/a><\/p>\n

\n\t <\/p>\n

\n\t <\/p>\n","protected":false},"excerpt":{"rendered":"

Optotherm, Sewickley, Pa., recently developed the IS640 radiometric infrared camera designed for thermographic applications requiring high sensitivity, resolution, and accuracy.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,450,435,436,1],"tags":[],"class_list":["post-4085","post","type-post","status-publish","format-standard","hentry","category-electronics","category-general","category-news","category-news-articles","category-uncategorized"],"yoast_head":"\nOptotherm infrared camera based on amorphous silicon microbolometer technology - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26808329\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Optotherm infrared camera based on amorphous silicon microbolometer technology - 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