{"id":4127,"date":"2016-06-18T21:11:23","date_gmt":"2016-06-18T21:11:23","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26580424\/NEWS\/"},"modified":"2023-02-07T04:53:03","modified_gmt":"2023-02-07T04:53:03","slug":"multifunctional-heating-and-electrical-system-enables-in-situ-tem-and-sem-analysis","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26580424\/NEWS\/","title":{"rendered":"Multifunctional heating and electrical system enables in-situ TEM and SEM analysis"},"content":{"rendered":"<p>\n\tProtochips, Morrisville, N.C., &nbsp;has released its Fusion multi-functional heating and electrical system for&nbsp;in-situ electron microscopy. The system combines heating, electrical, and electrothermal analysis, and features advanced holder and E-chip technology that provide ultra-high stability and accuracy. The system provides the ability to study and image materials at elevated temperatures with electrical biasing, or both heating and electrical, using one universal TEM or SEM holder.<\/p>\n<p>\n\tFusion was engineered to provide superior thermal uniformity, ultra-low drift, and attoamp electrical sensitivity. The large family of available interchangeable E-chips sample supports means research possibilities are infinite.<\/p>\n<p>\n\tFusion for Heating&nbsp;combines new low-power E-chips with holders constructed using special alloys to dissipate heat. The result is minimal sample drift during heating experiments up to a maximum of 2100\u00b0F. With only nanometers of displacement during changes of hundreds of degrees, a researcher can easily follow an area of interest even at the highest magnifications when heating and quenching the sample at rates up to 1830\u00b0F\/msec. Only Protochips&#8217; patented ceramic heating technology provides uniformity of over 99.5% across the entire imaging area to guarantee repeatable and accurate heating experiments.<\/p>\n<p>\n\tFusion for Electrical offers ultra-low parasitic E-chip sample supports to provide single digit picoamp measurements with sensitivity into the attoamps. With over 30 different electrical E- chip variations, there is a sample support for every application.<\/p>\n<p>\n\tFusion for Electrothermal&nbsp;combines the benefits of electrical and heating into a single E-chip sample support solution, allowing researchers to study electrical properties, including electric fields, at elevated temperatures.<\/p>\n<p>\n\tPowerful, intuitive&nbsp;Clarity software&nbsp;allows users to program electrical and\/or thermal stimuli as waveforms or change parameters as the research progresses. Data is observed in real time with a visual user interface that plots results. Optional ImageSync software&nbsp;synchronizes images with the heating and electrical data, so analyzing results is fast and effortless.<\/p>\n<p>\n\t<a href=\"http:\/\/www.protochips.com\/\">www.protochips.com<\/a><\/p>\n<p>\n\t&nbsp;<\/p>\n<p>\n\t&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Protochips, Morrisville, N.C.,  has released its Fusion multi-functional heating and electrical system for in-situ electron microscopy.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,450,438,435,436,1],"tags":[],"class_list":["post-4127","post","type-post","status-publish","format-standard","hentry","category-electronics","category-general","category-nanotechnology","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Multifunctional heating and electrical system enables in-situ TEM and SEM analysis - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26580424\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Multifunctional heating and electrical system enables in-situ TEM and SEM analysis - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Protochips, Morrisville, N.C., has released its Fusion multi-functional heating and electrical system for in-situ electron microscopy.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26580424\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2016-06-18T21:11:23+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-07T04:53:03+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26580424\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26580424\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Multifunctional heating and electrical system enables in-situ TEM and SEM analysis\",\"datePublished\":\"2016-06-18T21:11:23+00:00\",\"dateModified\":\"2023-02-07T04:53:03+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26580424\\\/NEWS\\\/\"},\"wordCount\":325,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Electronics\",\"general\",\"Nanotechnology\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26580424\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26580424\\\/NEWS\\\/\",\"name\":\"Multifunctional heating and electrical system enables in-situ TEM and SEM analysis - 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