{"id":4159,"date":"2016-04-24T15:51:00","date_gmt":"2016-04-24T15:51:00","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/"},"modified":"2023-02-07T04:53:05","modified_gmt":"2023-02-07T04:53:05","slug":"software-enables-automated-reporting-of-surface-analyses-from-3d-optical-microscopes","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/","title":{"rendered":"Software enables automated reporting of surface analyses from 3D optical microscopes"},"content":{"rendered":"<p>\n\tBruker Corp., San Jose, Calif., and Digital Surf, France, announce that Bruker Nano Surfaces is offering Vision64 Map data analysis and reporting software, which enables streamlined access to automated reporting of advanced surface measurements in 11 languages, while ensuring compatibility across a wide range of industry standards. Vision64 Map is designed to work with Bruker&#8217;s 3D optical microscope systems, including Contour Elite, ContourGT, NPFLEX, and the new Contour CMM. Vision64 Map is an extension to Bruker&#8217;s Vision64 instrument control and analysis software, and is based on Digital Surf&#8217;s Mountains Technology software platform.<\/p>\n<p>\n\tVision64 Map enables more comprehensive 3D surface visualization and analytical data with Bruker&#8217;s white light interferometry\u2013based 3D optical microscope systems. A complete user workflow is now available, including automated data acquisition and advanced data analysis, followed by powerful data visualization and reporting. Multiple image enhancement tools provide best representation of detailed features of interest.<\/p>\n<p>\n\tThe software is powerful enough to give power users access to advanced, very customizable functions, yet it is easy enough to use for production monitoring on manufacturing floors. For example, users can easily plot measurement results from a number of samples and set upper and lower critical limits for trending analysis and production control. The software also allows users to characterize surfaces in accordance with the latest metrology standards, including ISO, ASME B46.1, DIN, JIS, and their equivalents in other geographic regions of the world.<\/p>\n<p>\n\t&nbsp;&#8220;We have a long tradition of providing the industry&#8217;s top metrology, automation, and analysis solutions,&#8221; said James Earle, Vice President and General Manager of Bruker&#8217;s Tribology, Stylus and Optical Metrology Business. &#8220;Integrating Digital Surf&#8217;s ability to seamlessly translate data into complete reports tailored to specific regions and standards requirements creates the ultimate value for our customers.&#8221;<\/p>\n<p>\n\t&#8220;Digital Surf has been working with leading metrology instruments manufacturers, laboratories and standards committees from around the world to develop software that takes the fullest advantage of the imaging and measurement data today&#8217;s precision instruments acquire,&#8221; added Fran\u00e7ois Blateyron, Chief Operating Officer of Digital Surf. &#8220;Our partnership with Bruker and their industry-leading profilers is another step in this endeavor, giving operators and industrial engineers truly one-stop surface metrology solutions.&#8221;<\/p>\n<p>\n\tAutomotive component manufacturers now have the ability to assess functional performance of automotive products with a full set of 2D parameters developed by the automotive industry. Or engineers can compare measured data with CAD data or user-defined nominal form for powerful dimensional analysis of component geometry. Optional add-on capabilities expand analyses, filters, and standards compliance to match user-specific requirements. Available modules for Vision64 Map include 2D and 3D advanced surface texture modules, an advanced contour module, an automotive module, a statistics module, and a 3D Fourier and wavelets module.<\/p>\n<p>\n\t<a href=\"http:\/\/www.bruker.com\/\">www.bruker.com<\/a><\/p>\n<p>\n\t&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Bruker Corp., San Jose, Calif., and Digital Surf,  France, announce that Bruker Nano Surfaces is offering Vision64 Map data analysis and reporting software, which enables streamlined access to automated reporting of advanced surface measurements in 11 languages, while ensuring compatibility across a wide range of industry standards.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[443,434,450,435,436,1],"tags":[],"class_list":["post-4159","post","type-post","status-publish","format-standard","hentry","category-automobiles-and-ground-transportation","category-electronics","category-general","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Software enables automated reporting of surface analyses from 3D optical microscopes - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Software enables automated reporting of surface analyses from 3D optical microscopes - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Bruker Corp., San Jose, Calif., and Digital Surf, France, announce that Bruker Nano Surfaces is offering Vision64 Map data analysis and reporting software, which enables streamlined access to automated reporting of advanced surface measurements in 11 languages, while ensuring compatibility across a wide range of industry standards.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2016-04-24T15:51:00+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-07T04:53:05+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Software enables automated reporting of surface analyses from 3D optical microscopes\",\"datePublished\":\"2016-04-24T15:51:00+00:00\",\"dateModified\":\"2023-02-07T04:53:05+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/\"},\"wordCount\":470,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Automobiles and Ground Transportation\",\"Electronics\",\"general\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/\",\"name\":\"Software enables automated reporting of surface analyses from 3D optical microscopes - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2016-04-24T15:51:00+00:00\",\"dateModified\":\"2023-02-07T04:53:05+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/26271866\\\/NEWS\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Software enables automated reporting of surface analyses from 3D optical microscopes\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Software enables automated reporting of surface analyses from 3D optical microscopes - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/","og_locale":"en_US","og_type":"article","og_title":"Software enables automated reporting of surface analyses from 3D optical microscopes - Electronic Device Failure Analysis Society","og_description":"Bruker Corp., San Jose, Calif., and Digital Surf, France, announce that Bruker Nano Surfaces is offering Vision64 Map data analysis and reporting software, which enables streamlined access to automated reporting of advanced surface measurements in 11 languages, while ensuring compatibility across a wide range of industry standards.","og_url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2016-04-24T15:51:00+00:00","article_modified_time":"2023-02-07T04:53:05+00:00","twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/"},"author":{"name":"","@id":""},"headline":"Software enables automated reporting of surface analyses from 3D optical microscopes","datePublished":"2016-04-24T15:51:00+00:00","dateModified":"2023-02-07T04:53:05+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/"},"wordCount":470,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"articleSection":["Automobiles and Ground Transportation","Electronics","general","news","News Articles"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/","url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/","name":"Software enables automated reporting of surface analyses from 3D optical microscopes - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2016-04-24T15:51:00+00:00","dateModified":"2023-02-07T04:53:05+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/26271866\/NEWS\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Software enables automated reporting of surface analyses from 3D optical microscopes"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/4159","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63082"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=4159"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/4159\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=4159"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=4159"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=4159"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}