\n\tJeol USA, Peabody, Mass., introduces the JSM-IT100 scanning electron microscope, which features expanded EDS analysis capabilities and ports for multiple detectors. The latest addition to its InTouchScope Series, it is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design. A versatile workhorse SEM that can be configured to meet individual lab requirements, it offers high resolution imaging and a range of acceleration voltages at both high and low-vacuum modes.<\/p>\n
\n\tThe IT100 is an intuitive, high-throughput microscope designed to streamline workflow in any lab. Touchscreen operation, or traditional keyboard and mouse interface are at the operator’s fingertips. Fast data acquisition makes imaging and analysis of samples a simple task.<\/p>\n
\n\tIt is simple to quickly obtain high quality images using both secondary electron and backscatter imaging. The embedded Jeol EDS system with silicon drift detector technology now includes spectral mapping, multi-point analysis, automatic drift compensation, partial area, line scan, and mapping filter functions.<\/p>\n
\n\tThe InTouchScope series includes the NeoScope benchtop SEM with selectable HV\/LV, and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.<\/p>\n
\n\tThe IT100 was demonstrated for the first time in the United States at ISTFA in Portland, Oregon.<\/p>\n