{"id":4244,"date":"2015-10-19T02:30:14","date_gmt":"2015-10-19T02:30:14","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/25853821\/NEWS\/"},"modified":"2023-02-07T04:53:12","modified_gmt":"2023-02-07T04:53:12","slug":"jeol-introduces-third-generation-neoscope-sem-with-upgraded-functionality","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/25853821\/NEWS\/","title":{"rendered":"Jeol introduces third-generation Neoscope SEM with upgraded functionality"},"content":{"rendered":"

\n\tJeol USA, Peabody, Mass., introduces the JSM-6000Plus, the third generation of the popular NeoScope benchtop SEM, which delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The instrument makes it possible to bring basic high-resolution imaging and analysis features of a full-sized SEM into the lab. It fits into both small spaces and economical budgets, and its simple operation and versatile functions complement the workflow with optical microscopes or larger SEMs.<\/span><\/p>\n

\n\tJeol understands that even the smallest microscope needs the flexibility of selectable high and low kV, selectable beam currents, and up to 60,000X magnification to be a valuable resource.<\/p>\n

\n\tNew features enhance this flexibility. The JSM-6000Plus now offers high sensitivity backscatter electron detection with a BSE detector manufactured by Jeol to detect contrast between areas of the sample with different chemical compositions.<\/p>\n

\n\tThe simplicity of design with touchscreen operation make the NeoScope an ergonomic, easy-to-operate SEM for rapid inspection of electronics, pharmaceuticals, forensic evidence, and a wide variety of materials and organic samples.<\/p>\n

\n\tThe JEOL NeoScope is the culmination of more than 50 years of expertise in SEM development and is supported by the award-winning service organization at Jeol USA.<\/p>\n

\n\tThe NeoScope is available exclusively from Nikon Metrology Inc., a leading supplier of optical microscopes, through a business alliance between Jeol and Nikon.<\/p>\n

\n\twww.jeolusa.com<\/a><\/p>\n

\n\t <\/p>\n","protected":false},"excerpt":{"rendered":"

Jeol USA, Peabody, Mass., introduces the JSM-6000Plus, the third generation of the popular NeoScope benchtop SEM, which delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[450,435,436,1],"tags":[],"class_list":["post-4244","post","type-post","status-publish","format-standard","hentry","category-general","category-news","category-news-articles","category-uncategorized"],"yoast_head":"\nJeol introduces third-generation Neoscope SEM with upgraded functionality - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/25853821\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Jeol introduces third-generation Neoscope SEM with upgraded functionality - 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