{"id":4356,"date":"2015-01-19T12:13:11","date_gmt":"2015-01-19T12:13:11","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/23432104\/NEWS\/"},"modified":"2023-02-07T04:53:20","modified_gmt":"2023-02-07T04:53:20","slug":"craic-adds-raman-microspectroscopy-to-its-microspectrophotometer","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/23432104\/NEWS\/","title":{"rendered":"Craic adds Raman microspectroscopy to its microspectrophotometer"},"content":{"rendered":"<p>\n\tCraic Technologies, San Dimas, Calif., has added Raman microspectroscopy to its flagship product, the 20\/30 Perfect Vision microspectrophotometer. Users of the 20\/30 PV now have the ability to acquire Raman spectra, with multiple laser wavelengths, in addition to UV-visible-NIR absorbance, reflectance, fluorescence and emission microspectra. The 20\/30 PV is able to acquire all these types of spectra micron scale samples rapidly and easily.<\/p>\n<p>\n\tBetter yet, it is able to acquire all these spectra from the same area because it features proprietary optical aperturing technology. Additionally, the 20\/30 PV features the ability to acquire images of these same microscopic samples in the UV, visible, and NIR regions.<\/p>\n<p>\n\tThe applications for such a multi-purpose instrument are numerous. For example, the 20\/30 PV is used to develop the latest advanced materials, such as graphene and carbon nanotubes; to analyze forensic samples; and to measure thin film thickness in the semiconductor industry.<\/p>\n<p>\n\t&#8220;CRAIC Technologies has long been an innovator in the field of UV-visible-NIR microanalysis. We have helped to advance the field of microscale analysis by constantly developing new instrumentation as well as with research and teaching.<\/p>\n<p>\n\tThe 20\/30 PV\u2122 microspectrophotometer is a self-contained unit that features advanced UV-visible-NIR light sources, solid state lasers, true UV-visible-NIR microscopy, sensitive Lightblades spectrometers, and sophisticated Lambdafire, spectral and imaging software. Raman microspectroscopy is added with the Apollo Raman microspectroscopy packages. Each Apollo is a self-contained package including laser, spectrometer and hardware.&nbsp;<\/p>\n<p>\n\thttp:\/\/www.microspectra.com&nbsp;<\/p>\n<p>\n\t&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Craic Technologies, San Dimas, Calif., has added Raman microspectroscopy to its flagship product, the 20\/30 Perfect Vision microspectrophotometer.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,450,438,435,436,1],"tags":[],"class_list":["post-4356","post","type-post","status-publish","format-standard","hentry","category-electronics","category-general","category-nanotechnology","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Craic adds Raman microspectroscopy to its microspectrophotometer - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/23432104\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Craic adds Raman microspectroscopy to its microspectrophotometer - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Craic Technologies, San Dimas, Calif., has added Raman microspectroscopy to its flagship product, the 20\/30 Perfect Vision microspectrophotometer.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/23432104\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2015-01-19T12:13:11+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-07T04:53:20+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/23432104\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/23432104\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Craic adds Raman microspectroscopy to its microspectrophotometer\",\"datePublished\":\"2015-01-19T12:13:11+00:00\",\"dateModified\":\"2023-02-07T04:53:20+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/23432104\\\/NEWS\\\/\"},\"wordCount\":242,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Electronics\",\"general\",\"Nanotechnology\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/23432104\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/23432104\\\/NEWS\\\/\",\"name\":\"Craic adds Raman microspectroscopy to its microspectrophotometer - 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