\n\tBruker Nano Surfaces Division, Tucson, Ariz., announces the release of Inspire, the first integrated scanning probe microscopy infrared system for 10-nm spatial resolution in chemical and materials property mapping. The system incorporates Bruker’s proprietary PeakForce IR mode to enable nanoscale infrared reflection and absorption mapping for a wide range of applications. These include the characterization of chemical heterogeneity in complex materials and thin films.<\/p>\n
\n\tThe Inspire system features sensitivity down to molecular monolayers, even on samples not amenable to standard atomic force microscopy techniques. Inspire utilizes fully integrated infrared scattering, scanning near-field optical microscope (SNOM) optics, point-and-click alignment, and the full suite of exclusive PeakForce Tapping technologies. The resulting Inspire solution provides instant access to the highest resolution chemical, plasmonics, nanomechanical, and electrical characterization.<\/span><\/p>\n \n\t“The infrared scattering SNOM technique has great potential for new scientific discoveries through highest resolution spatio-spectral imaging,” explained Professor Markus B. Raschke, Departments of Physics and Chemistry, and JILA, at the University of Colorado, Boulder. “Its wide, productive application has been held back by the lack of an integrated solution.” <\/p>\n