\n\tBruker Corp., Santa Barbara, Calif., presents an online coating analyzer, the S2 Kodiak, which is based on X-ray fluorescence spectrometry. It delivers information about both coating thickness and layer composition in real time. Applications include analysis of sheet metal, glass, thin-film solar cells, and polymer films. Data enables coating manufacturers to optimize coating processes while establishing higher product quality.<\/p>\n
\n\tWith its new custom-designed high-resolution silicon drift detector and rugged X-ray tube technology, the S2 Kodiak delivers outstanding accuracy and precision in layer thickness monitoring, allowing instant feedback to the production process.<\/p>\n
\n\tWith a fully enclosed stainless steel cabinet and advanced Peltier-cooled detector, the S2 Kodiak can be mounted in any direction above or below sheet metal, glass, or polymer films, or can be integrated into any coating process. It is designed to run autonomously and maintenance-free and starts analyzing instantly after being powered up. The remote controlled analyzer unit connects to plant control software and transfers results via TCP\/IP. Continuous 24\/7 operation is supported by outstanding instrument uptime and Bruker’s worldwide service and support network.<\/p>\n
\n\tIn contrast to other thickness gauges, it requires no radioactive sources and operates at lower power, thereby enhancing worker safety and ensuring easy integration into coating operations.<\/p>\n