{"id":4494,"date":"2014-02-24T03:44:54","date_gmt":"2014-02-24T03:44:54","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/17428155\/NEWS\/"},"modified":"2023-02-07T04:53:30","modified_gmt":"2023-02-07T04:53:30","slug":"modular-microscope-enables-fast-substrate-thickness-measurement","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/17428155\/NEWS\/","title":{"rendered":"Modular microscope enables fast substrate thickness measurement"},"content":{"rendered":"<p>\n\tUltraTec Manufacturing Inc., Santa Ana, Calif., offers the ICis modular microscope, which allows for fast substrate thickness measurements of backside thinned and polished samples. It &nbsp;offers up to three standard modes, often required by professionals in the electronics and related industries. The system is designed to be a primary tool for the engineer or technician working at a nearby polishing station.<\/p>\n<p>\n\t<span style=\"font-family: Helvetica, Arial, sans-serif; font-size: 0.9375em; line-height: 1.333333333em;\">&nbsp;ICis is also invaluable for fast imaging and archiving of die samples being parallel polished \/ de-processed.&nbsp; The system accepts UltraTec&#8217;s&nbsp;ASAP-1 sample mounting plates and UltraPol Advance quick release sample holders.<\/span><\/p>\n<p>\n\t<span style=\"font-family: Helvetica, Arial, sans-serif; font-size: 0.9375em; line-height: 1.333333333em;\">Three Imaging Modes are available &#8212; NIR as standard, with options for UV and high res visible. &nbsp;The ICis&#8217;&nbsp;Custom software includes imaging, image optimization, annotation, Silicon Thickness measurement, navigation and archival functions.<\/span><\/p>\n<p>\n\tKey applications of ICis are in Imaging topside x-section &amp; backside electronic polished samples. ICis is an invaluable tool for validation of polished surface quality and for assessing de-processing position.<\/p>\n<p>\n\t<a href=\"http:\/\/www.ultratecusa.com\/icis-microscope\" style=\"font-family: Helvetica, Arial, sans-serif; font-size: 0.9375em; line-height: 1.333333333em;\">http:\/\/www.ultratecusa.com\/icis-microscope<\/a><\/p>\n<p>\n\t&nbsp;<\/p>\n<p>\n\t&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>UltraTec Manufacturing Inc., Santa Ana, Calif., offers the ICis modular microscope, which allows for fast substrate thickness measurements of backside thinned and polished samples.<\/p>\n","protected":false},"author":63082,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[450,435,436,1],"tags":[],"class_list":["post-4494","post","type-post","status-publish","format-standard","hentry","category-general","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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