Southwest Research Institute, San Antonio, is now home to a field emission scanning electron microscope, a powerful materials characterization tool that will aid in the research and development of a wide range of materials systems, including thin films and nanomaterials. The microscope\u2019s powerful magnification capabilities can produce clear, sharp images of objects magnified over 1,000,000 times. Additionally, the instrument\u2019s onboard energy dispersive x-ray spectrometer enables localized chemical analysis of the materials being imaged.<\/p>\n
\u201cThis exceptional new tool will allow us to image and chemically analyze materials at much higher magnifications than we could previously,\u201d said John Macha, manager of SwRI\u2019s Materials Science and Failure Analysis Section. \u201cThis will enable us to perform detailed materials characterization as well as research and development involving thin films and other material systems exhibiting extremely small length scales.\u201d<\/p>\n
The microscope will be especially useful to SwRI\u2019s Surface Engineering Laboratory, where engineers use various processes to modify the surface of materials for improved properties. SwRI performs analytical testing, failure analysis, prototype or technology development, pilot production and manufacturing implementation support, serving the aircraft, automotive, defense, energy, medical, offshore\/subsea, printing, security and space industries.<\/p>\n
Macha noted that the microscope also supports research into the synthesis of graphene, a material composed of a hexagonal lattice of carbon atoms. The microscope is also being used to evaluate thin films composed of high entropy alloys.<\/p>\n
\u201cThis new microscope will serve researchers across many different disciplines,\u201d Macha said. \u201cFor instance, our space scientists will use it to evaluate ultrathin films and other coatings for spacecraft instrumentation. Hypersonics researchers can evaluate how different coating technologies protect objects traveling extremely fast and prevent them from deteriorating.\u201d<\/p>\n
The field emission scanning electron microscope additionally supports root-cause failure analysis activities for the power generation, aerospace and transportation industries. Engineers will use the instrument to zoom in on extremely fine fracture features to assess the active damage mechanisms that led to failure. This powerful microscope will allow SwRI to expand its failure analysis capabilities.<\/p>\n
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