{"id":4820,"date":"2022-08-18T21:46:48","date_gmt":"2022-08-18T21:46:48","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/gatan-introduces-the-metro-in-situ-counting-camera-for-microscopy-imaging-below-200-kv\/"},"modified":"2023-02-23T21:21:20","modified_gmt":"2023-02-23T21:21:20","slug":"gatan-introduces-the-metro-in-situ-counting-camera-for-microscopy-imaging-below-200-kv","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/","title":{"rendered":"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV"},"content":{"rendered":"<p>Ametek Gatan Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched the Metro, a cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ transmission electron microscopy (TEM) below 200 kV.<\/p>\n<p>In today\u2019s \u201cpublish or perish\u201d environment, many microscopists believe that a 300 kV TEM is a necessary piece of lab equipment and the only way a lab can acquire results worthy of publishing in high-impact journals. However, these 300 kV microscopes are expensive to purchase and maintain, which limits their accessibility to only major research institutions or large corporations.<\/p>\n<p>\u201cOur first concern, when creating the Metro camera, was for the everyday scientist. We wanted to ensure that a lab without a 300 kV microscope and a very large budget can get stunning results from their current microscopes,\u201d says Cory Czarnik, Imaging and In-Situ product manager at Gatan. \u201cBy optimizing the Metro camera for 200 kV microscopes, we have extended counting in-situ capabilities to ensure that labs can successfully image the finest details from the most delicate of samples without a significant capital investment.\u201d<\/p>\n<p>Using a proprietary sensor, this novel in-situ counting camera has virtually no background noise, resulting in an increased signal-to-noise ratio at low doses for very sensitive samples. Additionally, the streamlined interface and unparalleled processing tools in DigitalMicrograph make the camera attractive for multi-user facilities and leading materials researchers.<\/p>\n<p>\u201cWith this release of the Metro camera, we are now bringing this unique counting technology to every lab working in material science applications,\u201d commented Narayan Vishwanathan, Vice President and Business Unit Manager of AMETEK Electron Microscopy Technologies. \u201cWe now bring an optimal low-dose solution to labs around the world for a wide range of material types and beam-sensitive samples such as 2D materials, battery materials, polymers, environmental TEM, and liquid-cell TEM.\u201d<\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>Ametek Gatan, Inc.<\/p>\n<p><a href=\"http:\/\/www.gatan.com\" target=\"_blank\" rel=\"noopener\">www.gatan.com<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Ametek Gatan Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched the Metro, a cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ transmission electron microscopy below 200 kV.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[445,437,435,436,1],"tags":[],"class_list":["post-4820","post","type-post","status-publish","format-standard","hentry","category-batteries-and-energy-storage","category-materials-testing-and-evaluation","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Ametek Gatan Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched the Metro, a cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ transmission electron microscopy below 200 kV.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2022-08-18T21:46:48+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:21:20+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV\",\"datePublished\":\"2022-08-18T21:46:48+00:00\",\"dateModified\":\"2023-02-23T21:21:20+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/\"},\"wordCount\":322,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Batteries and Energy Storage\",\"Materials Testing and Evaluation\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/\",\"name\":\"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2022-08-18T21:46:48+00:00\",\"dateModified\":\"2023-02-23T21:21:20+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49546871\\\/NEWS\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/","og_locale":"en_US","og_type":"article","og_title":"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV - Electronic Device Failure Analysis Society","og_description":"Ametek Gatan Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched the Metro, a cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ transmission electron microscopy below 200 kV.","og_url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2022-08-18T21:46:48+00:00","article_modified_time":"2023-02-23T21:21:20+00:00","twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/"},"author":{"name":"","@id":""},"headline":"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV","datePublished":"2022-08-18T21:46:48+00:00","dateModified":"2023-02-23T21:21:20+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/"},"wordCount":322,"commentCount":0,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"articleSection":["Batteries and Energy Storage","Materials Testing and Evaluation","news","News Articles"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/","url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/","name":"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2022-08-18T21:46:48+00:00","dateModified":"2023-02-23T21:21:20+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49546871\/NEWS\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/4820","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63103"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=4820"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/4820\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=4820"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=4820"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=4820"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}