{"id":4949,"date":"2019-10-20T11:48:48","date_gmt":"2019-10-20T11:48:48","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/nikon-advanced-2d-3d-x-ray-methods-enable-failure-analysis-of-electronic-devices\/"},"modified":"2023-02-23T21:22:11","modified_gmt":"2023-02-23T21:22:11","slug":"nikon-advanced-2d-3d-x-ray-methods-enable-failure-analysis-of-electronic-devices","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/38616267\/NEWS\/","title":{"rendered":"Nikon advanced 2D\/3D x-ray methods enable failure analysis of electronic devices"},"content":{"rendered":"<p style=\"margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"line-height:normal\"><span style=\"color:#333333\">Researchers from Nikon Metrology, Brighton, Mich., at ISTFA 2019 will present a discussion of modern 2D and 3D x-ray-based approaches for testing and failure analysis, and describe how these different methods have practical application for failure analysis and dimensional metrology. These advanced technologies are among the most useful nondestructive testing methods that enable the inspection of an object\u2019s internal features without cutting or disassembling the sample. <\/span><\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"line-height:normal\"><span style=\"color:#333333\">Some of the techniques that can be used for NDT include radiography, laminography, computed tomography, limited angle tomography, and computed laminography. They can be of assistance in the determination of voids\/porosity, flaws, cracks, and inclusions within manufactured parts from the electronics industry. <\/span><\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"line-height:normal\"><span style=\"color:#333333\">As the global manufacturing industry continues to grow and require top tier safety and quality standards, x-ray technologies and techniques provide the visualization and metrology analysis necessary to meet those demands.<\/span><\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><b>Title: \u201cModern 2D &amp; 3D X-ray technologies for testing and failure analysis\u201d<\/b><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"background:white\"><span style=\"line-height:normal\"><i><span style=\"border:none windowtext 1.0pt;color:#333333;padding:0in\">Authors: Dr. Herminso Villaraga-G\u00f3mez<\/span><\/i><i><span style=\"color:#333333\">, <b><span style=\"border:none windowtext 1.0pt;padding:0in\">Mr. Joshua Bell, Master in Physics, <\/span><\/b><span style=\"border:none windowtext 1.0pt;padding:0in\">Nikon Metrology, Inc., Brighton, Michigan <\/span><\/span><\/i><\/span><\/span><\/p>\n<p style=\"margin-bottom:.0001pt\">&nbsp;<\/p>\n<p style=\"margin-bottom:.0001pt\"><span style=\"line-height:normal\"><a href=\"https:\/\/www.asminternational.org\/web\/istfa-2019\/home\">https:\/\/www.asminternational.org\/web\/istfa-2019\/home<\/a> <\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Researchers from Nikon Metrology, Brighton, Mich., at ISTFA 2019 will present a discussion of modern 2D and 3D x-ray-based approaches for testing and failure analysis, and describe how these different methods have practical application for failure analysis and dimensional metrology.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,435,436,1],"tags":[],"class_list":["post-4949","post","type-post","status-publish","format-standard","hentry","category-electronics","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - 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