{"id":5024,"date":"2022-07-20T13:19:53","date_gmt":"2022-07-20T13:19:53","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/new-cypher-l-atomic-force-microscope-provides-higher-resolution-and-a-simpler-user-experience-for-core-nanoscience-research-fields\/"},"modified":"2023-02-23T21:22:39","modified_gmt":"2023-02-23T21:22:39","slug":"new-cypher-l-atomic-force-microscope-provides-higher-resolution-and-a-simpler-user-experience-for-core-nanoscience-research-fields","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/","title":{"rendered":"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields"},"content":{"rendered":"<p>Oxford Instruments Asylum Research, Santa Barbara, Calif., launched its new Cypher L atomic force microscope (AFM). Based on the high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.<\/p>\n<p>The Cypher L provides higher performance than other AFMs in this segment, approaching the ultra-high performance of its Cypher S and Cypher ES family members, while remaining affordable and accessible to typical research funding sources.<\/p>\n<p>The Cypher L is the first AFM operating exclusively on the new Asylum Research Ergo software platform, which provides a streamlined workflow and imaging automation for a simplified user experience. The Cypher L is the only AFM in this market segment that is specifically designed to be upgradeable, which allows researchers to invest in a quality AFM platform and then upgrade to add new capabilities as they need them.<\/p>\n<p>\u201cThe Cypher L will set a new, higher performance standard for research AFMs at this price point. Many researchers need a higher performance AFM that provides core characterization techniques without all the added complexity and expense of more advanced modes and capabilities,\u201d said Mario Viani, President at Asylum Research. \u201cOther AFMs in this segment try to do everything but fall short in performance because they are built on outdated AFM platforms. The Cypher L enables researchers to buy a top-tier research AFM and then upgrade as their requirements evolve.\u201d<\/p>\n<p>The Cypher L is available now and joins the rest of the Asylum Research Cypher AFM family. The Cypher S is the next step up from the Cypher L and features ultra-high resolution, faster scanning, and a vast range of supported imaging modes. The Cypher ES adds exceptional environmental control capabilities to the platform while maintaining the ultra-high performance of the Cypher S. Finally, the Cypher VRS1250 is the pinnacle of the Cypher family, adding high-speed imaging at true video-rate speeds up to 45 frames per second. Cypher customers can upgrade from any point in the AFM family to the more advanced models.<\/p>\n<p>&nbsp;<\/p>\n<p>\nFor more information:<\/p>\n<p>Oxford Instruments Asylum Research<\/p>\n<p><a href=\"https:\/\/AFM.oxinst.com\/CypherL\" target=\"_blank\" rel=\"noopener\">https:\/\/AFM.oxinst.com\/CypherL<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Oxford Instruments Asylum Research, Santa Barbara, Calif., launched its new Cypher L atomic force microscope, designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[441,437,435,436,1],"tags":[],"class_list":["post-5024","post","type-post","status-publish","format-standard","hentry","category-materials-properties-and-performance","category-materials-testing-and-evaluation","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Oxford Instruments Asylum Research, Santa Barbara, Calif., launched its new Cypher L atomic force microscope, designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2022-07-20T13:19:53+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:22:39+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields\",\"datePublished\":\"2022-07-20T13:19:53+00:00\",\"dateModified\":\"2023-02-23T21:22:39+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/\"},\"wordCount\":375,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Materials Properties and Performance\",\"Materials Testing and Evaluation\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/\",\"name\":\"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2022-07-20T13:19:53+00:00\",\"dateModified\":\"2023-02-23T21:22:39+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/49218516\\\/NEWS\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/","og_locale":"en_US","og_type":"article","og_title":"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields - Electronic Device Failure Analysis Society","og_description":"Oxford Instruments Asylum Research, Santa Barbara, Calif., launched its new Cypher L atomic force microscope, designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.","og_url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2022-07-20T13:19:53+00:00","article_modified_time":"2023-02-23T21:22:39+00:00","twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/"},"author":{"name":"","@id":""},"headline":"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields","datePublished":"2022-07-20T13:19:53+00:00","dateModified":"2023-02-23T21:22:39+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/"},"wordCount":375,"commentCount":0,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"articleSection":["Materials Properties and Performance","Materials Testing and Evaluation","news","News Articles"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/","url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/","name":"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2022-07-20T13:19:53+00:00","dateModified":"2023-02-23T21:22:39+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/49218516\/NEWS\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/5024","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63103"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=5024"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/5024\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=5024"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=5024"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=5024"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}