{"id":5297,"date":"2017-12-18T03:05:19","date_gmt":"2017-12-18T03:05:19","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/olympus-mx63-microscope-systems-optimized-for-analysis-of-large-wafers-circuit-boards\/"},"modified":"2023-02-23T21:24:34","modified_gmt":"2023-02-23T21:24:34","slug":"olympus-mx63-microscope-systems-optimized-for-analysis-of-large-wafers-circuit-boards","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/30251210\/NEWS\/","title":{"rendered":"Olympus MX63 microscope systems optimized for analysis of large wafers, circuit boards"},"content":{"rendered":"<p><span><span>Olympus Scientific Solutions Corp., Waltham, Mass., announces that the <\/span><span><span>MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Modular design enables users to choose the components needed to tailor the system to an application.<\/span><\/span><\/span><\/p>\n<p><span><span><span>These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with Olympus Stream image analysis software, the entire workflow, from observation to report creation, can be simplified.<\/span><\/span><\/span><\/p>\n<p><span><span><span>The MX63 series&rsquo; versatile observation capabilities provide clear, sharp images so users can reliably detect defects in their samples. New illumination techniques and image acquisition options within Olympus Stream image analysis software give users more choices for evaluating samples and documenting their findings.<\/span><\/span><\/span><\/p>\n<p><span><span><span>MIX observation technology produces unique observation images by combining darkfield with another observation method, such as brightfield, fluorescence, or polarization. MIX observation enables users to view defects that are difficult to see with conventional microscopes. The circular LED illuminator used for darkfield observation has a directional darkfield function where only one quadrant is illuminated at a given time. This reduces halation and is useful for visualizing surface texture.<\/span><\/span><\/span><\/p>\n<p><span><span><span><span>With multiple image alignment (MIA), users can stitch images together quickly and easily simply by moving the KY knobs on the manual stage&mdash;a motorized stage is not necessary. Stream software uses pattern recognition to generate a panoramic image, giving a wider field of view.<\/span><\/span><\/span><\/span><\/p>\n<p><span><span><span><span>The Extended Focus Imaging (EFI) function within Stream captures images of samples whose height extends beyond the depth of focus of the objective and stacks them together to create one image that is all in focus. EFI can be executed with either a manual or motorized Z-axis and creates a height map for easy structure visualization. It is also possible to construct an EFI image while offline within Stream Desktop.<\/span><\/span><\/span><\/span><\/p>\n<p><span><a href=\"http:\/\/www.olympus.com\"><span>www.olympus.com<\/span><\/a><\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Olympus Scientific Solutions Corp., Waltham, Mass., announces that the MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,435,436,1],"tags":[],"class_list":["post-5297","post","type-post","status-publish","format-standard","hentry","category-electronics","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Olympus MX63 microscope systems optimized for analysis of large wafers, circuit boards - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/30251210\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Olympus MX63 microscope systems optimized for analysis of large wafers, circuit boards - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Olympus Scientific Solutions Corp., Waltham, Mass., announces that the MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/30251210\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2017-12-18T03:05:19+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:24:34+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/30251210\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/30251210\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Olympus MX63 microscope systems optimized for analysis of large wafers, circuit boards\",\"datePublished\":\"2017-12-18T03:05:19+00:00\",\"dateModified\":\"2023-02-23T21:24:34+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/30251210\\\/NEWS\\\/\"},\"wordCount\":329,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Electronics\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/30251210\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/30251210\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/30251210\\\/NEWS\\\/\",\"name\":\"Olympus MX63 microscope systems optimized for analysis of large wafers, circuit boards - 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