{"id":5361,"date":"2018-05-07T21:14:01","date_gmt":"2018-05-07T21:14:01","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/jeol-adds-new-monochromated-arm200f-to-its-atomic-resolution-tem-family\/"},"modified":"2023-02-23T21:24:58","modified_gmt":"2023-02-23T21:24:58","slug":"jeol-adds-new-monochromated-arm200f-to-its-atomic-resolution-tem-family","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/34417632\/NEWS\/","title":{"rendered":"JEOL adds new monochromated ARM200F to its atomic-resolution TEM family"},"content":{"rendered":"

JEOL USA, Peabody, Mass., introduces the new JEM-ARM200F atomic resolution analytical transmission electron microscope that achieves a guaranteed high angle annular dark field resolution of 80 picometers. The company say that the instrument sets a new benchmark for advanced, aberration-corrected S\/TEM technology with the highest resolution commercially available in its class. T<\/span><\/span><\/p>\n

With advanced analytical capabilities, the JEM-ARM200F enables both atom-by-atom imaging resolution and unmatched spatial resolution for atom-to-atom chemical mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy). The completely new electron column design integrates S\/TEM with Cs correction for atomic spatial energy resolution combined with high probe currents for microanalysis.<\/span><\/span><\/p>\n

The JEM-ARM200F offers the ultimate stability for imaging and analysis at the sub-nanometer scale. The electron column is isolated from the environmental disturbances found in most labs. A superior shielding design safeguards the ultrahigh-powered optics from airflow, vibration, and acoustical interference. Additional shielding ensures protection from electronic interference, magnetic fields, and thermal fluctuations. <\/span><\/span>The latest in software automation has been designed into the new ARM200F, with tomography and holography simplified by a user-friendly GUI.<\/span><\/span><\/p>\n

The University of Texas at San Antonio (UTSA) will be the site of the first installation of the new JEM-ARM200F. The microscope will be housed in the Advanced Microscopy Laboratory under the supervision of world-renowned researcher Miguel Yacaman, chair of the College of Sciences\u2019 Department of Physics and Astronomy. There, it will support first-class research in nanotechnology, materials science, medicine, biology, chemistry and engineering. <\/span><\/span><\/p>\n

www.jeolusa.com<\/span><\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

JEOL USA, Peabody, Mass., introduces the new JEM-ARM200F atomic resolution analytical transmission electron microscope that achieves a guaranteed high angle annular dark field resolution of 80 picometers.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,437,435,436,1],"tags":[],"class_list":["post-5361","post","type-post","status-publish","format-standard","hentry","category-electronics","category-materials-testing-and-evaluation","category-news","category-news-articles","category-uncategorized"],"yoast_head":"\nJEOL adds new monochromated ARM200F to its atomic-resolution TEM family - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/34417632\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"JEOL adds new monochromated ARM200F to its atomic-resolution TEM family - 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