{"id":5860,"date":"2022-02-16T13:27:20","date_gmt":"2022-02-16T13:27:20","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/contamination-disrupts-flash-chip-output-at-two-japan-plants\/"},"modified":"2023-02-23T21:28:12","modified_gmt":"2023-02-23T21:28:12","slug":"contamination-disrupts-flash-chip-output-at-two-japan-plants","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/","title":{"rendered":"Contamination disrupts flash chip output at two Japan plants"},"content":{"rendered":"<p>Operations at two Japanese factories producing flash memory chips have been disrupted by the contamination of industrial materials, chipmaker Kioxia said, as analysts warned of potential price hikes for the key smartphone components.<\/p>\n<p>It comes as the tech industry grapples with a global semiconductor shortage that has hampered the manufacturing of numerous products from cars to gaming consoles.<\/p>\n<p>Kioxia said it suspected \u201ccontamination of materials used in the manufacturing processes\u201d, leading to operations at the plants being partially suspended, but offered no further details.<\/p>\n<p>The company, a spin-off of Japanese conglomerate Toshiba, said it was working to restore full output at the factories in central and northern Japan as soon as possible.<\/p>\n<p>Kioxia\u2019s US-based partner, Western Digital, also confirmed the disruption and estimated it would cause \u201ca reduction of flash availability of at least 6.5 exabytes\u201d at the plants, which the two companies run as a joint venture. An exabyte is a unit of digital data equal to one billion gigabytes.<\/p>\n<p>The type of memory chips affected are called NAND flash chips. They are different from the semiconductors currently in short supply worldwide, which use older technology.<\/p>\n<p>\u201cIf this creates a shortage, then prices will rise,\u201d Jim Handy, a semiconductor industry expert at Objective Analysis, told AFP. Two factories being impacted \u201cimplies that a supplier shipped bad chemicals\u201d to Kioxia, he said. \u201cOther NAND flash makers are likely to purchase materials from the same supplier, so this could be a big issue.\u201d<\/p>\n<p>Kioxia, together with Western Digital, holds a 35 percent market share of the global flash memory industry, according to its website.<\/p>\n<p>\u201cThe consequences of this latest incident may push the price of NAND Flash in Q2 to spike 5-10 percent,\u201d said Taiwan-based market research firm TrendForce in a statement.<\/p>\n<p>&nbsp;<\/p>\n<p>For more information:<\/p>\n<p>Kioxia<\/p>\n<p><a href=\"https:\/\/www.kioxia.com\" target=\"_blank\" rel=\"noopener\">https:\/\/www.kioxia.com<\/a><\/p>\n<p>&nbsp;<\/p>\n<p>TechExplore<\/p>\n<p><a href=\"https:\/\/techxplore.com\/news\/2022-02-contamination-disrupts-chip-output-japan.html\" target=\"_blank\" rel=\"noopener\">https:\/\/techxplore.com\/news\/2022-02-contamination-disrupts-chip-output-japan.html<\/a><\/p>\n<p>&nbsp;<\/p>\n<p>Western Digital<\/p>\n<p><a href=\"https:\/\/www.westerndigital.com\/company\/newsroom\/press-releases\/2022\/2022-02-09-western-digital-comments-on-production-status-of-its-joint-venture-flash-memory-manufacturing-facilities\" target=\"_blank\" rel=\"noopener\">https:\/\/www.westerndigital.com\/company\/newsroom\/press-releases\/2022\/2022-02-09-western-digital-comments-on-production-status-of-its-joint-venture-flash-memory-manufacturing-facilities<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Operations at two Japanese factories producing flash memory chips have been disrupted by the contamination of industrial materials, chipmaker Kioxia said, as analysts warned of potential price hikes for the key smartphone components.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[446,434,444,441,437,435,436,1],"tags":[],"class_list":["post-5860","post","type-post","status-publish","format-standard","hentry","category-consumer-products","category-electronics","category-industries-and-applications","category-materials-properties-and-performance","category-materials-testing-and-evaluation","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Contamination disrupts flash chip output at two Japan plants - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Contamination disrupts flash chip output at two Japan plants - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Operations at two Japanese factories producing flash memory chips have been disrupted by the contamination of industrial materials, chipmaker Kioxia said, as analysts warned of potential price hikes for the key smartphone components.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2022-02-16T13:27:20+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:28:12+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Contamination disrupts flash chip output at two Japan plants\",\"datePublished\":\"2022-02-16T13:27:20+00:00\",\"dateModified\":\"2023-02-23T21:28:12+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/\"},\"wordCount\":331,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Consumer Products\",\"Electronics\",\"Industries and Applications\",\"Materials Properties and Performance\",\"Materials Testing and Evaluation\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/\",\"name\":\"Contamination disrupts flash chip output at two Japan plants - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2022-02-16T13:27:20+00:00\",\"dateModified\":\"2023-02-23T21:28:12+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/47217043\\\/NEWS\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Contamination disrupts flash chip output at two Japan plants\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Contamination disrupts flash chip output at two Japan plants - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/","og_locale":"en_US","og_type":"article","og_title":"Contamination disrupts flash chip output at two Japan plants - Electronic Device Failure Analysis Society","og_description":"Operations at two Japanese factories producing flash memory chips have been disrupted by the contamination of industrial materials, chipmaker Kioxia said, as analysts warned of potential price hikes for the key smartphone components.","og_url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2022-02-16T13:27:20+00:00","article_modified_time":"2023-02-23T21:28:12+00:00","twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/"},"author":{"name":"","@id":""},"headline":"Contamination disrupts flash chip output at two Japan plants","datePublished":"2022-02-16T13:27:20+00:00","dateModified":"2023-02-23T21:28:12+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/"},"wordCount":331,"commentCount":0,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"articleSection":["Consumer Products","Electronics","Industries and Applications","Materials Properties and Performance","Materials Testing and Evaluation","news","News Articles"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/","url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/","name":"Contamination disrupts flash chip output at two Japan plants - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2022-02-16T13:27:20+00:00","dateModified":"2023-02-23T21:28:12+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/47217043\/NEWS\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Contamination disrupts flash chip output at two Japan plants"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/5860","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63103"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=5860"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/5860\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=5860"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=5860"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=5860"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}