{"id":6028,"date":"2020-09-20T16:36:06","date_gmt":"2020-09-20T16:36:06","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/jeol-introduces-new-compact-field-emission-scanning-electron-microscope\/"},"modified":"2023-02-23T21:29:20","modified_gmt":"2023-02-23T21:29:20","slug":"jeol-introduces-new-compact-field-emission-scanning-electron-microscope","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/42006508\/NEWS\/","title":{"rendered":"JEOL introduces new compact field emission scanning electron microscope"},"content":{"rendered":"<p>JEOL, Peabody, Mass., introduces a compact, versatile field emission SEM that offers ultrahigh resolution and versatile analytical capabilities.<\/p>\n<p>The new JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both high and low vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded EDS microanalysis system providing \u201cLive EDS\u201d analysis during image observation.<\/p>\n<p>A new electron gun with spatial resolution of one nanometer &nbsp;and the ability to deliver over 300nA of beam current make this microscope ideally suited for imaging and analysis of nanostructures, electronic products, metals, soft materials, food, and biology.<\/p>\n<p>An exceptionally user-friendly software interface significantly simplifies observation and analysis in SEM, making the power of FE SEM accessible to all levels of users. The IT700HR allows seamless acquisition of data from observation to elemental analysis and subsequent reporting. A \u201cZeromag\u201d function links an optical image, SEM images, and EDS data for an instant map of analysis positions. Expanded functionality includes automated montage, movie capture of the live SEM image, and compatibility with Python scripting, live web viewing, and remote control.<\/p>\n<p><a href=\"http:\/\/www.jeolusa.com\">www.jeolusa.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>JEOL, Peabody, Mass., introduces a compact, versatile field emission SEM that offers ultrahigh resolution and versatile analytical capabilities.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[434,438,435,436,1],"tags":[],"class_list":["post-6028","post","type-post","status-publish","format-standard","hentry","category-electronics","category-nanotechnology","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>JEOL introduces new compact field emission scanning electron microscope - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/42006508\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"JEOL introduces new compact field emission scanning electron microscope - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"JEOL, Peabody, Mass., introduces a compact, versatile field emission SEM that offers ultrahigh resolution and versatile analytical capabilities.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/42006508\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2020-09-20T16:36:06+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:29:20+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/42006508\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/42006508\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"JEOL introduces new compact field emission scanning electron microscope\",\"datePublished\":\"2020-09-20T16:36:06+00:00\",\"dateModified\":\"2023-02-23T21:29:20+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/42006508\\\/NEWS\\\/\"},\"wordCount\":202,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Electronics\",\"Nanotechnology\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/42006508\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/42006508\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/42006508\\\/NEWS\\\/\",\"name\":\"JEOL introduces new compact field emission scanning electron microscope - 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