{"id":6063,"date":"2020-12-10T12:27:55","date_gmt":"2020-12-10T12:27:55","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/international-symposium-for-testing-and-failure-analysis-conference-proceedings-added-to-asm-digital-library\/"},"modified":"2023-02-23T21:29:33","modified_gmt":"2023-02-23T21:29:33","slug":"international-symposium-for-testing-and-failure-analysis-conference-proceedings-added-to-asm-digital-library","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/42814669\/NEWS\/","title":{"rendered":"International Symposium for Testing and Failure Analysis Conference Proceedings Added to ASM Digital Library"},"content":{"rendered":"<p>\nMATERIALS PARK, Ohio (December 10, 2020) \u2013 The <a href=\"https:\/\/www.asminternational.org\/web\/edfas\/home\/\">Electronic Device Failure Analysis Society<\/a> (EDFAS), an affiliate society of <a href=\"https:\/\/www.asminternational.org\/\">ASM International<\/a>, is proud to announce the launch of the <em>new <a href=\"https:\/\/dl.asminternational.org\/istfa\">ISTFA Proceedings <\/a><\/em>site in the <a href=\"https:\/\/dl.asminternational.org\/\">ASM Digital Library<\/a>. The new site provides convenient access to conference papers from the renowned International Symposium for Testing and Failure Analysis annual event.&nbsp;<\/p>\n<p>The transition of <em>ISTFA Proceedings<\/em> to the ASM Digital Library will bring more than 2,000 articles and case histories on all aspects of microelectronic device characterization and failure analysis published since 1996 to a content delivery platform offering \u201cbest of breed\u201d search, browse, filtering, linking, and content access. The ISTFA content is the first set of proceedings added to the ASM Digital Library. Proceedings papers from additional ASM conference series will be added in 2021.<\/p>\n<p>The ISTFA conference is the premier forum for information on all aspects of microelectronic device failure analysis. Topics covered in-depth in the collected proceedings include\u2026.<\/p>\n<ul>\n<li>\n<p>3D Devices and Packages<\/p>\n<\/li>\n<li>\n<p>System Level Analysis<\/p>\n<\/li>\n<li>\n<p>Counterfeit Microelectronics<\/p>\n<\/li>\n<li>\n<p>Advanced Methods and Techniques<\/p>\n<\/li>\n<li>\n<p>Failure Analysis Process<\/p>\n<\/li>\n<li>\n<p>Fault Isolation and Defect Localization<\/p>\n<\/li>\n<li>\n<p>Focused Ion Beam Analysis and Circuit Edit<\/p>\n<\/li>\n<li>\n<p>Focused Ion Beam Sample Preparation<\/p>\n<\/li>\n<li>\n<p>Hardware Attacks and Reverse Engineering<\/p>\n<\/li>\n<li>\n<p>Low Power Devices<\/p>\n<\/li>\n<li>\n<p>Microscopy<\/p>\n<\/li>\n<li>\n<p>Mixed Mode and High Power Devices<\/p>\n<\/li>\n<li>\n<p>Nanoprobing and Electrical Characterization<\/p>\n<\/li>\n<li>\n<p>Packaging and Assembly Analysis<\/p>\n<\/li>\n<li>\n<p>Product Yield, Test, and Diagnostics<\/p>\n<\/li>\n<li>\n<p>Sample Preparation and Deprocessing<\/p>\n<\/li>\n<li>\n<p>Scanning Probe Analysis<\/p>\n<\/li>\n<li>\n<p>Silicon Photonic Devices<\/p>\n<\/li>\n<\/ul>\n<p>The symposium has consistently provided attendees with the latest analysis techniques necessary to obtain accurate and timely information on device-related issues. The collected proceedings papers now available in the ASM Digital Library serve as a comprehensive reference of the state-of-the-art research, development, tools, and techniques as presented at ISTFA conferences over the most recent quarter decade.&nbsp;<\/p>\n<p>\u201cThe launch of <em>ISTFA Proceedings<\/em> enables convenient access to this valuable content to the EDFAS membership and the broader electronic device community,\u201d said Dr. James J. Demarest, EDFAS President. \u201cWe are very pleased that the ISTFA content was selected by ASM as the first set of conference content to be added to the ASM Digital Library. Enhancing the ability of ISTFA content to be discovered, accessed, and cited has been a significant goal of EDFAS.\u201d<\/p>\n<p>The <em>ISTFA Proceedings<\/em> site joins <a href=\"https:\/\/dl.asminternational.org\/handbooks\">ASM Handbooks Online<\/a>, <a href=\"https:\/\/dl.asminternational.org\/technical-books\">ASM Technical Books<\/a>, the <a href=\"https:\/\/dl.asminternational.org\/failure-analysis\">ASM Failure Analysis Database<\/a>, and <a href=\"https:\/\/dl.asminternational.org\/alloy-digest\">Alloy Digest<\/a> in the interactive ASM Digital Library platform. Additional resources are scheduled to be added to the platform in 2021.<\/p>\n<p>Full access to <em>ISTFA Proceedings<\/em> is provided as a benefit of membership in the Electronic Device Failure Analysis Society. Multiuser site licenses for companies and institutions are available. For information on subscription access to ISTFA Proceedings, contact the ASM Online Database Manager at <a href=\"mailto:onlinedbsales@asminternational.org?subject=ISTFA%20Proceedings\">onlinedbsales@asminternational.org<\/a>.&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The Electronic Device Failure Analysis Society (EDFAS), an affiliate society of ASM International, is proud to announce the launch of the new ISTFA Proceedings site in the ASM Digital Library. The new site provides convenient access  to conference papers from the renowned International Symposium for Testing and Failure Analysis annual event.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[435,436,1],"tags":[],"class_list":["post-6063","post","type-post","status-publish","format-standard","hentry","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>International Symposium for Testing and Failure Analysis Conference Proceedings Added to ASM Digital Library - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/42814669\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"International Symposium for Testing and Failure Analysis Conference Proceedings Added to ASM Digital Library - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"The Electronic Device Failure Analysis Society (EDFAS), an affiliate society of ASM International, is proud to announce the launch of the new ISTFA Proceedings site in the ASM Digital Library. 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