{"id":6069,"date":"2021-08-12T17:50:40","date_gmt":"2021-08-12T17:50:40","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/researchers-achieve-extraordinary-spatial-resolution-for-in-situ-atomic-resolution-tem-using-new-luminary-micro-technique\/"},"modified":"2023-02-23T21:29:35","modified_gmt":"2023-02-23T21:29:35","slug":"researchers-achieve-extraordinary-spatial-resolution-for-in-situ-atomic-resolution-tem-using-new-luminary-micro-technique","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/","title":{"rendered":"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique"},"content":{"rendered":"

Materials science researchers in Japan have achieved extraordinary in-situ transmission electron microscope (TEM) experiments using a new Luminary micro laser technique. They succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nanostructures. The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles.<\/p>\n

This experiment was conducted using a JEOL 300kV transmission electron microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments.<\/p>\n

The research group consists of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research, Osaka University.<\/p>\n

The details of this research were presented by Dr. Senga at the Microscopy and Microanalysis (M&M) 2021 Conference, held in the U. S. in August, 2021.<\/p>\n

 <\/p>\n

For more information:<\/p>\n

Advanced Industrial Science and Technology
\nhttps:\/\/www.aist.go.jp\/index_en.html<\/a><\/p>\n

JEOL
\nhttps:\/\/www.jeolusa.com<\/a><\/p>\n

JEOL-IDES Luminary Ultrafast TEM\/Dynamic TEM and Luminary Micro
\nhttps:\/\/www.jeolusa.com\/PRODUCTS\/Transmission-Electron-Microscopes-TEM\/JEOL-IDES-Luminary-Ultrafast-TEM-Dynamic-TEM<\/a><\/p>\n

Sanken Osaka University
\nhttps:\/\/www.sanken.osaka-u.ac.jp\/en\/<\/a><\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

Materials science researchers in Japan succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures achieving extraordinary in-situ transmission electron microscope results using a new Luminary micro laser technique.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[437,435,436,1],"tags":[],"class_list":["post-6069","post","type-post","status-publish","format-standard","hentry","category-materials-testing-and-evaluation","category-news","category-news-articles","category-uncategorized"],"yoast_head":"\nResearchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Materials science researchers in Japan succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures achieving extraordinary in-situ transmission electron microscope results using a new Luminary micro laser technique.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2021-08-12T17:50:40+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:29:35+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique\",\"datePublished\":\"2021-08-12T17:50:40+00:00\",\"dateModified\":\"2023-02-23T21:29:35+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/\"},\"wordCount\":250,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Materials Testing and Evaluation\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/\",\"name\":\"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2021-08-12T17:50:40+00:00\",\"dateModified\":\"2023-02-23T21:29:35+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45280433\\\/NEWS\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/","og_locale":"en_US","og_type":"article","og_title":"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique - Electronic Device Failure Analysis Society","og_description":"Materials science researchers in Japan succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures achieving extraordinary in-situ transmission electron microscope results using a new Luminary micro laser technique.","og_url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2021-08-12T17:50:40+00:00","article_modified_time":"2023-02-23T21:29:35+00:00","twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/"},"author":{"name":"","@id":""},"headline":"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique","datePublished":"2021-08-12T17:50:40+00:00","dateModified":"2023-02-23T21:29:35+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/"},"wordCount":250,"commentCount":0,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"articleSection":["Materials Testing and Evaluation","news","News Articles"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/","url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/","name":"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2021-08-12T17:50:40+00:00","dateModified":"2023-02-23T21:29:35+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45280433\/NEWS\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Researchers achieve extraordinary spatial resolution for in-situ atomic resolution TEM using new Luminary micro technique"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/6069","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63103"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=6069"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/6069\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=6069"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=6069"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=6069"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}