{"id":6097,"date":"2021-07-18T16:18:40","date_gmt":"2021-07-18T16:18:40","guid":{"rendered":"https:\/\/staging.asminternational.org\/edfas\/next-generation-cartesian-geometry-edxrf-spectrometer-set-to-transform-xrf-technology\/"},"modified":"2023-02-23T21:29:43","modified_gmt":"2023-02-23T21:29:43","slug":"next-generation-cartesian-geometry-edxrf-spectrometer-set-to-transform-xrf-technology","status":"publish","type":"post","link":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/","title":{"rendered":"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology"},"content":{"rendered":"<p>Applied Rigaku Technologies Inc., Austin, Texas, a division of Rigaku Corp., introduces NEX CG II, a powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer. The NEX CG II is a multi-element, multi-purpose indirect analyzer that delivers rapid qualitative and quantitative elemental analyses and addresses needs across many industries. It provides non-destructive elemental analysis of sodium to uranium in almost any matrix.<\/p>\n<p>The NEX CG II complements Rigaku\u2019s existing range of benchtop and in-line process control EDXRF spectrometers and builds on NEX CG\u2019s legacy of using full 90\u00b0 Cartesian Geometry and secondary targets for trace level sensitivity.<\/p>\n<p>The new superior analytical power of the NEX CG II is provided by a 50 kV 50 W end-window palladium-anode x-ray tube, monochromatic or polarized excitation from five secondary targets, and a high-performance large-area silicon drift detector. This unique optical kernel, combined with Rigaku\u2019s advanced RPF-SQX Fundamental Parameters software, delivers the most sensitive EDXRF measurements in the industry.<\/p>\n<p>The NEX CG II serves a broad range of applications and industries and is an ideal tool for measuring ultra-low and trace element concentrations all the way up to percent levels.<\/p>\n<p>Some of the key advantages and features that make NEX CG II an attractive proposition include:<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Non-destructive elemental analysis for sodium (Na) to uranium (U)<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Rapid elemental analyses of solids, liquids, powders, coatings, and thin films<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Indirect excitation for exceptionally low detection limits<br \/>\n\u2022&nbsp;&nbsp; &nbsp;High-power 50 kV, 50 W x-ray tube<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Large-area high-throughput silicon drift detector (SDD)<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Analysis in air, helium, or vacuum<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Powerful and easy to use QuantEZ software with multilingual user interface<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Advanced RPF-SQX Fundamental Parameters software featuring scattering FP<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Rigaku profile fitting (RPF) advanced algorithm for peak deconvolution<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Various automatic sample changers accommodating up to 52 mm samples<br \/>\n\u2022&nbsp;&nbsp; &nbsp;Low cost of ownership backed by a two-year warranty<\/p>\n<p>It is easy for non-technical operators to use and powerful enough for expert use in commercial labs and R&amp;D facilities. NEX CG II also features 3D optics, which dramatically increases the peak-to-background ratio. This results in a spectrometer capable of trace element analysis \u2014 even in challenging sample types.<\/p>\n<p>&nbsp;<\/p>\n<p>Image &#8211; <em>Rigaku NEX CG II Advanced Cartesian Geometry EDXRF Spectrometer<\/em>.<\/p>\n<p>\nFor more information:<\/p>\n<p>Applied Rigaku Technologies<br \/>\n<a href=\"https:\/\/www.rigaku.com\" target=\"_blank\" rel=\"noopener\">https:\/\/www.rigaku.com<\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Applied Rigaku Technologies Inc., Austin, Texas, a division of Rigaku Corp., introduces NEX CG II, a powerful second-generation benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer.<\/p>\n","protected":false},"author":63103,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[437,435,436,1],"tags":[],"class_list":["post-6097","post","type-post","status-publish","format-standard","hentry","category-materials-testing-and-evaluation","category-news","category-news-articles","category-uncategorized"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Applied Rigaku Technologies Inc., Austin, Texas, a division of Rigaku Corp., introduces NEX CG II, a powerful second-generation benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:published_time\" content=\"2021-07-18T16:18:40+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2023-02-23T21:29:43+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/\"},\"author\":{\"name\":\"\",\"@id\":\"\"},\"headline\":\"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology\",\"datePublished\":\"2021-07-18T16:18:40+00:00\",\"dateModified\":\"2023-02-23T21:29:43+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/\"},\"wordCount\":408,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"articleSection\":[\"Materials Testing and Evaluation\",\"news\",\"News Articles\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/\",\"name\":\"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\"},\"datePublished\":\"2021-07-18T16:18:40+00:00\",\"dateModified\":\"2023-02-23T21:29:43+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/results\\\/-\\\/journal_content\\\/56\\\/10192\\\/45025685\\\/NEWS\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#website\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"contentUrl\":\"https:\\\/\\\/cdn-prd-main.asm-media.cloud\\\/uploads\\\/sites\\\/41\\\/2022\\\/10\\\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"\",\"url\":\"https:\\\/\\\/www.asminternational.org\\\/edfas\\\/author\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/","og_locale":"en_US","og_type":"article","og_title":"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology - Electronic Device Failure Analysis Society","og_description":"Applied Rigaku Technologies Inc., Austin, Texas, a division of Rigaku Corp., introduces NEX CG II, a powerful second-generation benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer.","og_url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/","og_site_name":"Electronic Device Failure Analysis Society","article_published_time":"2021-07-18T16:18:40+00:00","article_modified_time":"2023-02-23T21:29:43+00:00","twitter_card":"summary_large_image","twitter_misc":{"Written by":"","Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/#article","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/"},"author":{"name":"","@id":""},"headline":"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology","datePublished":"2021-07-18T16:18:40+00:00","dateModified":"2023-02-23T21:29:43+00:00","mainEntityOfPage":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/"},"wordCount":408,"commentCount":0,"publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"articleSection":["Materials Testing and Evaluation","news","News Articles"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/","url":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/","name":"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2021-07-18T16:18:40+00:00","dateModified":"2023-02-23T21:29:43+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/results\/-\/journal_content\/56\/10192\/45025685\/NEWS\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Next-generation cartesian geometry EDXRF spectrometer set to transform XRF technology"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"","url":"https:\/\/www.asminternational.org\/edfas\/author\/"}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/6097","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63103"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=6097"}],"version-history":[{"count":0,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/posts\/6097\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=6097"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/categories?post=6097"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/tags?post=6097"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}